Abstract: A method for detecting defects on a wafer including the steps of obtaining a reference image of a chip pattern formed on a reference wafer, using a computer algorithm to analyze the reference image to produce a division map for the chip pattern; setting respective thresholds for divisions of the division map, obtaining a comparison data between a test image of the chip pattern formed on a test wafer and the reference image, using the division map and the thresholds to examine the comparison data to identify a defect in the test image.

Abstract: An optimal dynamic seam adjustment system for image stitching includes an image obtaining module, a feature difference calculation module and a dynamic seam module. The image obtaining module obtains at least two images to be stitched, which have at least one overlapping area divided into a plurality of pixels arranged in a plurality of pixel columns and a plurality of pixel rows. The feature difference calculation module calculates a feature difference value for each pixel within the overlapping area. The dynamic seam module establishes a plurality of dynamic seam routes started from a top end of the overlapping area, so as to find an optimal dynamic seam route based on the feature difference value, wherein each dynamic seam route is composed of a plurality of pixels.

Abstract: An optimal dynamic seam adjustment system for image stitching includes an image obtaining module, a feature difference calculation module and a dynamic seam module. The image obtaining module obtains at least two images to be stitched, which have at least one overlapping area divided into a plurality of pixels arranged in a plurality of pixel columns and a plurality of pixel rows. The feature difference calculation module calculates a feature difference value for each pixel within the overlapping area. The dynamic seam module establishes a plurality of dynamic seam routes started from a top end of the overlapping area, so as to find an optimal dynamic seam route based on the feature difference value, wherein each dynamic seam route is composed of a plurality of pixels.

Abstract: A system for restoring original configuration after timeout and the method thereof are provided. After the invention determines that a local control device does not send a response message to a remote network device during a response time, and the network configuration of the local control device is restored to an original configuration backed up beforehand. The disclosed system and the method automatically restore the error configuration by a remote network device, and achieve the effect of reducing manpower and time.