Abstract: A semiconductor device includes a substrate, a dielectric layer disposed over the substrate, and an interconnect structure extending through the dielectric layer. The dielectric layer includes a low-k dielectric material which includes silicon carbonitride having a carbon content ranging from about 30 atomic % to about 45 atomic %. The semiconductor device further includes a thermal dissipation feature extending through the dielectric layer and disposed to be spaced apart from the interconnect structure.

Abstract: The present invention relates to a method for cleaning a metal etching chamber. The method is accomplished by using waterless auto cleaning first, followed by an Argon clean. The waterless auto cleaning process comprises two steps. First, oxygen plasma is used to eliminate the byproducts produced from the side reaction with photo resistant in the etching reaction. Second, chlorine plasma is used to eliminate the byproducts produced from the side reaction with a metal thin film under a photo resistant and the residual oxygen of the previous step. The Argon clean can further eliminate the residual chlorine of the previous step and the products produced in the chemical reaction during the process of waterless auto clean.