Patents by Inventor Kai-Di CHUANG

Kai-Di CHUANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for aligning probe card in semiconductor device testing
    Patent number: 10866276
    Abstract: A method for probe card alignment is provided. The method includes providing a probe card with a plurality of probe needles having their distal ends on a reference plane. The method further includes providing a light from both the upper side and lower side of the reference plane. The method also includes using a camera to image the probe needles. In addition, the method includes performing a probe card alignment process according to the image generated by the camera.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: December 15, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
    Inventors: Kai-Di Chuang, Tien-Chung Lee, Chiu-Hua Chung, Kang-Tai Peng
  • METHOD AND SYSTEM FOR ALIGNING PROBE CARD IN SEMICONDUCTOR DEVICE TESTING
    Publication number: 20200110131
    Abstract: A method for probe card alignment is provided. The method includes providing a probe card with a plurality of probe needles having their distal ends on a reference plane. The method further includes providing a light from both the upper side and lower side of the reference plane. The method also includes using a camera to image the probe needles. In addition, the method includes performing a probe card alignment process according to the image generated by the camera.
    Type: Application
    Filed: December 10, 2019
    Publication date: April 9, 2020
    Inventors: Kai-Di CHUANG, Tien-Chung LEE, Chiu-Hua CHUNG, Kang-Tai PENG
  • Method and system for aligning probe card in semiconductor device testing
    Patent number: 10509071
    Abstract: A method for probe card alignment is provided. The method includes providing a probe card with a plurality of probe needles having their distal ends on a reference plane. The method further includes providing a light from both the upper side and lower side of the reference plane. The method also includes using a camera to image the probe needles. In addition, the method includes performing a probe card alignment process according to the image generated by the camera.
    Type: Grant
    Filed: November 18, 2016
    Date of Patent: December 17, 2019
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Kai-Di Chuang, Tien-Chung Lee, Chiu-Hua Chung, Kang-Tai Peng
  • METHOD AND SYSTEM FOR ALIGNING PROBE CARD IN SEMICONDUCTOR DEVICE TESTING
    Publication number: 20180143244
    Abstract: A method for probe card alignment is provided. The method includes providing a probe card with a plurality of probe needles having their distal ends on a reference plane. The method further includes providing a light from both the upper side and lower side of the reference plane. The method also includes using a camera to image the probe needles. In addition, the method includes performing a probe card alignment process according to the image generated by the camera.
    Type: Application
    Filed: November 18, 2016
    Publication date: May 24, 2018
    Inventors: Kai-Di CHUANG, Tien-Chung LEE, Chiu-Hua CHUNG, Kang-Tai PENG