Patents by Inventor Kai IMHÄUSER

Kai IMHÄUSER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260133023
    Abstract: A computer-implemented method of setting control parameters for a CMM, the CMM comprising a probe having a sensor to determine at least one coordinate of one or more measurement points on the surface of an object, one or more actuators, and a control unit configured to control the actuators according to pre-defined control parameters to move the probe to a target position, the method comprising controlling, by the control unit, the actuators to excite one or more portions of the CMM; receiving a sensor feedback signal comprising sensor values captured by the sensor while the portions of the CMM are being excited, the sensor values being indicative of an acceleration of the probe; determining a behaviour of the CMM based on the received sensor feedback signal; and computing adapted control parameters for the control unit based on the determined behaviour.
    Type: Application
    Filed: November 7, 2025
    Publication date: May 14, 2026
    Applicant: HEXAGON INNOVATION HUB GMBH
    Inventors: Kai IMHÄUSER, Rainer SUN, Claudio ISELI
  • Patent number: 12553703
    Abstract: A method for controlling a distance between a non-contact measurement probe head of a CMM and a work piece during a measurement. The method comprises providing steering commands to steer the work piece and/or the probe head through a measuring path comprising measuring positions, performing at a measuring position a measuring step comprising providing distance adjustment steering commands to set the distance between the probe head and the work piece, projecting a primary measuring beam pattern onto the work piece, acquiring a secondary measuring beam pattern originating from an interaction of the primary measuring beam with the work piece, deriving surface information based on the secondary measuring beam pattern, deriving information regarding the distance between the probe head and the work piece, deriving a distance deviation based on a distance target the derived distance information, providing the distance deviation for a distance adjustment performed at a subsequent measuring position.
    Type: Grant
    Filed: November 29, 2023
    Date of Patent: February 17, 2026
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Patrick Ilg, Pete Champ, Patryk Wroclawski, Sascha Schiwy, Kai Imhäuser
  • Publication number: 20240200929
    Abstract: A method for controlling a distance between a non-contact measurement probe head of a CMM and a work piece during a measurement. The method comprises providing steering commands to steer the work piece and/or the probe head through a measuring path comprising measuring positions, performing at a measuring position a measuring step comprising providing distance adjustment steering commands to set the distance between the probe head and the work piece, projecting a primary measuring beam pattern onto the work piece, acquiring a secondary measuring beam pattern originating from an interaction of the primary measuring beam with the work piece, deriving surface information based on the secondary measuring beam pattern, deriving information regarding the distance between the probe head and the work piece, deriving a distance deviation based on a distance target the derived distance information, providing the distance deviation for a distance adjustment performed at a subsequent measuring position.
    Type: Application
    Filed: November 29, 2023
    Publication date: June 20, 2024
    Applicant: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Patrick ILG, Pete CHAMP, Patryk WROCLAWSKI, Sascha SCHIWY, Kai IMHÄUSER