Abstract: A resource allocation controller for a touch-sensitive apparatus, comprising: a timing module for obtaining timing information; a timeslot counter configured to output an indication of a current timeslot of a plurality of timeslots based on the obtained timing information; an allocation module configured to allocate a first resource to one of a first function and a second function during a first timeslot of the plurality of timeslots and to allocate the first resource to the other of the first function and the second function during a second timeslot of the plurality of timeslots; and wherein the resource allocation controller is configured to indicate to a function execution module to which of the first function and the second function the first resource is allocated to during the first timeslot, and to indicate to the function execution module a function to which the first resource is allocated.

Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.