Patents by Inventor Kai Kuparinen

Kai Kuparinen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy
    Patent number: 7233643
    Abstract: A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: June 19, 2007
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Tero Eklin, Kai Kuparinen
  • Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy
    Publication number: 20060262900
    Abstract: A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.
    Type: Application
    Filed: May 20, 2005
    Publication date: November 23, 2006
    Inventors: Heikki Sipila, Tero Eklin, Kai Kuparinen