Patents by Inventor Kai-Ti Huang

Kai-Ti Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method, system, and computer program product for implementing electronic designs with automatically generated power intent
    Patent number: 10204180
    Abstract: Various embodiments implement an electronic design with automatically generated power intent. One or more inputs to a physical electronic design implementation module may be identified for power intent generation for an electronic design. The power intent for the electronic design may be generated by using at least one or more power related characteristics that are determined from at least the one or more inputs for the power intent generation. With the generated power intent, the electronic design may be implemented at least by guiding the implementation of the electronic design with at least the generated power intent while reducing usage of one or more computing resources.
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: February 12, 2019
    Assignee: Cadence Design Systems, Inc.
    Inventors: Kai-Ti Huang, Pinhong Chen, Richard M. Chou
  • Method and system for performing statistical leakage characterization, analysis, and modeling
    Patent number: 8069432
    Abstract: A method, system, and computer program product are disclosed for performing statistical leakage power characterization to estimate yield of a circuit in terms of leakage power. According to some approaches, this is performed with consideration of bi-exponential modeling.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: November 29, 2011
    Assignee: Cadence Design Systems, Inc.
    Inventors: Lizheng Zhang, Hongliang Chang, Kai-Ti Huang, Vassilios Gerousis
  • METHOD AND SYSTEM FOR PERFORMING STATISTICAL LEAKAGE CHARACTERIZATION, ANALYSIS, AND MODELING
    Publication number: 20100083198
    Abstract: A method, system, and computer program product are disclosed for performing statistical leakage power characterization to estimate yield of a circuit in terms of leakage power. According to some approaches, this is performed with consideration of bi-exponential modeling.
    Type: Application
    Filed: September 30, 2008
    Publication date: April 1, 2010
    Inventors: Lizheng Zhang, Hongliang Chang, Kai-Ti Huang, Vassilios Gerousis