Patents by Inventor Kai Uwe Mettendorf

Kai Uwe Mettendorf has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10429326
    Abstract: An X-ray optics assembly for an X-ray diffractometer is provided, comprising a multilayer mirror, in particular a Goebel mirror, and a switching system with which beam paths for an X-ray beam are selectable. The X-ray optics assembly includes a monochromator, in particular a channel-cut crystal, and three beam paths for the X-ray beam are selectable using the switching system. A first beam path in a first position of the switching system leads past the multilayer mirror and leads past the monochromator, a second beam path in a second position of the switching system contains the multilayer mirror and leads past the monochromator, and a third beam path in a third position of the switching system contains the multilayer mirror and contains the monochromator. The invention provides an X-ray optics assembly and an X-ray diffractometer which may be used even more universally for various measurement geometries in a simple manner.
    Type: Grant
    Filed: December 6, 2016
    Date of Patent: October 1, 2019
    Inventors: Frank Hans Hoffman, Kai Uwe Mettendorf
  • Publication number: 20170176356
    Abstract: An X-ray optics assembly for an X-ray diffractometer is provided, comprising a multilayer mirror, in particular a Goebel mirror, and a switching system with which beam paths for an X-ray beam are selectable. The X-ray optics assembly includes a monochromator, in particular a channel-cut crystal, and three beam paths for the X-ray beam are selectable using the switching system. A first beam path in a first position of the switching system leads past the multilayer mirror and leads past the monochromator, a second beam path in a second position of the switching system contains the multilayer mirror and leads past the monochromator, and a third beam path in a third position of the switching system contains the multilayer mirror and contains the monochromator. The invention provides an X-ray optics assembly and an X-ray diffractometer which may be used even more universally for various measurement geometries in a simple manner.
    Type: Application
    Filed: December 6, 2016
    Publication date: June 22, 2017
    Inventors: Frank Hans HOFFMAN, Kai Uwe METTENDORF
  • Patent number: 7852983
    Abstract: An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance. The movement of the main center of rotation relative to the guidance can be easily driven by means of one single motor.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: December 14, 2010
    Assignee: Bruker AXS GmbH
    Inventors: Kai Uwe Mettendorf, Claus Bolzinger, Joachim Lange
  • Publication number: 20090262895
    Abstract: An X-ray diffractometer (1; 24; 30) has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source (2) and detector (3; 31) are respectively disposed, at the same time and in a correlated fashion, wherein the ?-angle can be scanned, and at the same time a ?-?-geometry (Bragg-Brentano measurement geometry) is always maintained. This is achieved in that each goniometer leg (or linkage (5, 6; 25, 26)) has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance (13; 13a, 13b) that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance.
    Type: Application
    Filed: April 16, 2009
    Publication date: October 22, 2009
    Applicant: Bruker AXS GmbH
    Inventors: Kai Uwe Mettendorf, Claus Bolzinger, Joachim Lange