Patents by Inventor Kai-Yi Tang

Kai-Yi Tang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ANTENNA TESTING DEVICE FOR HIGH FREQUENCY ANTENNAS
    Publication number: 20230333150
    Abstract: A testing device for testing an antenna is provided. The testing device includes a housing, an antenna module for holding the antenna and disposed under the housing, and a receiving module disposed on the housing. The antenna module includes a base and a flexible film disposed on the base. The receiving module includes a substrate, a coupling radiation element disposed on the substrate and a support disposed on the substrate and having an opening. The antenna is partially exposed from the opening.
    Type: Application
    Filed: June 22, 2023
    Publication date: October 19, 2023
    Inventors: Chi-Chang LAI, Kai-Yi TANG, Mill-Jer WANG
  • Antenna testing device and method for high frequency antennas
    Patent number: 11726122
    Abstract: A testing device for testing an antenna is provided. The testing device includes a housing, an antenna module, and a receiving module. The antenna module is used for holding the antenna and disposed on the housing, wherein the antenna is coupled to an antenna testing apparatus. The receiving module is disposed on the housing and includes a coupling radiation element physically separated from the antenna, wherein the receiving module is configured to receive an excited signal emitted from the antenna.
    Type: Grant
    Filed: June 29, 2020
    Date of Patent: August 15, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Chi-Chang Lai, Kai-Yi Tang, Mill-Jer Wang
  • ANTENNA TESTING DEVICE AND METHOD FOR HIGH FREQUENCY ANTENNAS
    Publication number: 20210405102
    Abstract: A testing device for testing an antenna is provided. The testing device includes a housing, an antenna module, and a receiving module. The antenna module is used for holding the antenna and disposed on the housing, wherein the antenna is coupled to an antenna testing apparatus. The receiving module is disposed on the housing and includes a coupling radiation element physically separated from the antenna, wherein the receiving module is configured to receive an excited signal emitted from the antenna.
    Type: Application
    Filed: June 29, 2020
    Publication date: December 30, 2021
    Inventors: Chi-Chang LAI, Kai-Yi TANG, Mill-Jer WANG
  • Testing apparatus and method
    Patent number: 9285394
    Abstract: A test apparatus includes a DUT block, at least one probe and at least one variable-length pusher. The DUT block is used for allowing the DUT to be disposed thereon. The probe is located on the DUT block. The variable-length pusher is located above the probe. The actuator is used for moving the variable-length pusher to push against the DUT to force the DUT to be in electrical contact with the probe.
    Type: Grant
    Filed: January 9, 2014
    Date of Patent: March 15, 2016
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventor: Kai-Yi Tang
  • Testing Apparatus And Method
    Publication number: 20150192610
    Abstract: A test apparatus includes a DUT block, at least one probe and at least one variable-length pusher. The DUT block is used for allowing the DUT to be disposed thereon. The probe is located on the DUT block. The variable-length pusher is located above the probe. The actuator is used for moving the variable-length pusher to push against the DUT to force the DUT to be in electrical contact with the probe.
    Type: Application
    Filed: January 9, 2014
    Publication date: July 9, 2015
    Applicant: Taiwan Semiconductor Manufacturing CO., LTD.
    Inventor: Kai-Yi Tang