Abstract: A room area acquisition method includes: setting a room area initial value according to an air conditioner model parameter; acquiring a stable operation duration and a number of stop times of an air conditioner outdoor unit from starting up and stable operation to stopping at a temperature point; estimating a deviation between the room area initial value and a room area actual value according to the stable operation duration and the number of stop times, and outputting a deviation result; adjusting the room area initial value according to the deviation result, and performing estimation again according to an adjusted room area value; and taking the current room area value as the room area actual value when a deviation result output by current estimation is different from a deviation result output by last estimation.

Abstract: Disclosed are a narrow gap laser-TIG arc hybrid welding apparatus and method. The welding apparatus includes a welding gun body, a swing welding gun assembly, a welding wire feeding and heating assembly, and a gas conveying assembly; the swing welding gun assembly includes a welding gun rotating shaft, a stepper motor, a large gear, a pinion, an upper insulating sleeve, a lower insulating sleeve, a tungsten electrode clamp, and a tungsten electrode; the stepper motor is mounted on a motor connection seat; the pinion is mounted on the output shaft of the stepper motor; the large gear is mounted on the welding gun rotating shaft; the pinion is engaged with the large gear; the welding gun rotating shaft is mounted and positioned on the welding gun body; the tungsten electrode is mounted at the tail end of the welding gun rotating shaft by means of the tungsten electrode clamp.

Abstract: A system includes an engine including a valvetrain comprising one or more intake valves and one or more exhaust valves, a variable valve actuation (VVA) system electronically controllable to vary operation of the valvetrain to selectably operate the engine in either a Miller cycle or a non-Miller cycle, and an electronic control system configured to control the VVA system to change operation of the engine from the Miller-cycle to the non-Miller cycle if an engine speed condition is satisfied, a peak cylinder pressure (PCP) condition is satisfied, at least one of an air-fuel ratio (AFR) condition and an oxygen-fuel-control (OFC) condition is satisfied, and a minimum off time condition for the VVA system is satisfied.

Abstract: A detection system for a SlimSAS slot and a method thereof are disclosed. In the detection system, a detecting device generates and transmits a detection signal to a TAP controller; the TAP controller converts the received detection signal into a detection signal in JTAG format, and transmits the detection signal in JTAG format to a CPLD chip and a controllable power module chip of a detection card and/or a boundary scan chip of a circuit board; a detection can be performed on the SMBus pins, the differential signal receiving pins, the differential signal transmitting pins, the clock pins, the sideband pins and the ground pins of the SlimSAS connection interface through the boundary scan chip, the HCSL to LVDS module chip, the IIC chip and the CPLD chip. Therefore, the technical effect of improving slot stability and detection coverage of a SlimSAS slot detection can be achieved.

Abstract: The present invention discloses a superconducting nanowire single photon detector, comprises an arced fractal nanowire structure and the optical cavity structure; the arced fractal nanowire structures being used to alleviate the current-crowding effect and realize that the detection efficiency is insensitive to the polarization states of incident photons, and the arced fractal nanowire structures including parallel-connected arced fractal nanowires and serial-connected arced fractal nanowires; the optical cavity structure being used to achieve simultaneous optimization of the internal quantum efficiency and the absorption efficiency. The invention can be widely used in many fields such as optical communication, single-photon imaging, fluorescence detection, quantum optics, etc. The excellent performance of the detector can significantly promote the development and progress of these fields.

Abstract: Embodiments for forming improved bipolar transistors are provided, manufacturable by a CMOS IC process. The improved transistor comprises an emitter having first and second portions of different depths, a base underlying the emitter having a central portion of a first base width underlying the first portion of the emitter, a peripheral portion having a second base width larger than the first base width partly underlying the second portion of the emitter, and a transition zone of a third base width and lateral extent lying laterally between the first and second portions of the base, and a collector underlying the base. The gain of the transistor is larger than a conventional bipolar transistor made using the same CMOS process. By adjusting the lateral extent of the transition zone, the properties of the improved transistor can be tailored to suit different applications without modifying the underlying CMOS IC process.

Abstract: A multi-bit flash memory and a reading method thereof. Multiple reference memory cells for saving reserved data are provided to operate together with multiple data memory cells. Before the data memory cells are read, data stored in the reference memory cell is sensed based on a present reference current. Then, a value of a new reference current for reading the data memory cells is determined according to a difference between the sensed data and the reserved data.

Abstract: A method for programming a MLC memory includes (a) programming the bits of the memory having a Vt level lower than the PV level of a targeted programmed state into programmed bits by using a Vd bias BL; (b) ending this method if each bit of the memory has a Vt level not lower than the PV level of the targeted programmed state, otherwise, continuing the step (c); and (c) setting BL=BL+K1 and repeating the step (a) if each of the programmed bits has a Vt level lower than the PV level, while setting BL=BL?K2, and repeating the step (a) if at least one of the programmed bits has a Vt level not lower than the PV level.

Abstract: A multi-bit flash memory and a reading method thereof. Multiple reference memory cells for saving reserved data are provided to operate together with multiple data memory cells. Before the data memory cells are read, data stored in the reference memory cell is sensed based on a present reference current. Then, a value of a new reference current for reading the data memory cells is determined according to a difference between the sensed data and the reserved data.

Abstract: A multi-bit flash memory and a reading method thereof. Multiple reference memory cells for saving reserved data are provided to operate together with multiple data memory cells. Before the data memory cells are read, data stored in the reference memory cell is sensed based on a present reference current. Then, a value of a new reference current for reading the data memory cells is determined according to a difference between the sensed data and the reserved data.

Abstract: A method for programming a MLC memory is provided. The MLC memory has a number of bits, and each bit has a number of programmed states. Each programmed state has a first PV level. The method comprises (a) programming the bits of the memory having a Vt level lower than the PV level of a targeted programmed state into programmed bits by using a Vd bias BL; (b) ending this method if each bit of the memory has a Vt level not lower than the PV level of the targeted programmed state, otherwise, continuing the step (c); and (c) setting BL=BL+K1 and repeating the step (a) if each of the programmed bits has a Vt level lower than the PV level, while setting BL=BL?K2, and repeating the step (a) if at least one of the programmed bits has a Vt level not lower than the PV level.

Abstract: Methods for programming and program verification of a flash memory are described that ease the buried drain contact induced operation and increase the retention window. In a first aspect of the invention, a program operation method provides varying program biases which are applied to different groups of memory cells. The program biases can be supplied as drain bias voltages or gate bias voltages. The program biases vary depending on which group of memory cells is programmed. In one embodiment, a first drain voltage VD1 is applied to the first group of memory cells M0 and Mn. A second drain voltage VD2 is applied to the second group of memory cells M1 and Mn-1, where VD2=VD1+?VD. In a second aspect of the invention, a plurality of program verification voltage levels are selected to verify that the memory cells pass the program voltage levels.

Abstract: A method for programming a MLC memory is provided. The MLC memory has a number of bits, and each bit has a number of programmed states. Each programmed state has a first PV level. The method includes (a) programming the bits of the memory having a Vt level lower than the PV level of a targeted programmed state into programmed bits by using a Vd bias BL; (b) ending this method if each bit of the memory has a Vt level not lower than the PV level of the targeted programmed state, otherwise, continuing the step (c); and (c) setting BL=BL+K1 and repeating the step (a) if each of the programmed bits has a Vt level lower than the PV level, while setting BL=BL?K2, and repeating the step (a) if at least one of the programmed bits has a Vt level not lower than the PV level.

Abstract: A multi-bit flash memory and a reading method thereof. Multiple reference memory cells for saving reserved data are provided to operate together with multiple data memory cells. Before the data memory cells are read, data stored in the reference memory cell is sensed based on a present reference current. Then, a value of a new reference current for reading the data memory cells is determined according to a difference between the sensed data and the reserved data.

Abstract: A method for programming a MLC memory is provided. The MLC memory has a number of bits, and each bit has a number of programmed states. Each programmed state has a first PV level. The method comprises (a) programming the bits of the memory having a Vt level lower than the PV level of a targeted programmed state into programmed bits by using a Vd bias BL; (b) ending this method if each bit of the memory has a Vt level not lower than the PV level of the targeted programmed state, otherwise, continuing the step (c); and (c) setting BL=BL+K1 and repeating the step (a) if each of the programmed bits has a Vt level lower than the PV level, while setting BL=BL?K2, and repeating the step (a) if at least one of the programmed bits has a Vt level not lower than the PV level.

Abstract: Methods for programming and program verification of a flash memory are described that ease the buried drain contact induced operation and increase the retention window. In a first aspect of the invention, a program operation method provides varying program biases which are applied to different groups of memory cells. The program biases can be supplied as drain bias voltages or gate bias voltages. The program biases vary depending on which group of memory cells is programmed. In one embodiment, a first drain voltage VD1 is applied to the first group of memory cells M0 and Mn. A second drain voltage VD2 is applied to the second group of memory cells M1 and Mn-1, where VD2=VD1+?VD. In a second aspect of the invention, a plurality of program verification voltage levels are selected to verify that the memory cells pass the program voltage levels.