Abstract: The present application provides a semiconductor device and a manufacturing method thereof and a memory system. The manufacturing method of the semiconductor device includes: forming a dielectric layer on a stack layer, wherein memory channel structures penetrating through the stack layer along a first direction are disposed in the stack layer, and the first direction is parallel to a stacking direction of the stack layer; forming a plurality of openings penetrating through the dielectric layer along the first direction, with the rest of the dielectric layer forming top selective gate cut lines, wherein the plurality of openings are arranged as being spaced apart along a second direction, one of the top selective gate cut lines is located between two adjacent ones of the openings in the second direction, and the first direction intersects the second direction; and forming a top selective gate layer in the plurality of openings.

Abstract: The present invention provides systems and methods capable of collecting and analyzing a multi-fields two-dimensional code. A computer-implemented method of analyzing multi-fields two-dimensional code, comprises: receiving decoded multi-fields two dimensional code; identifying a first field and a second field from the decoded multi-fields two dimensional code; and determining whether the first field of the multi-fields two-dimensional code matches one of multiple pieces of pre-stored first information and whether the second field of the multi-fields two-dimensional code has ever been collected before, for providing a result with respect to the decoded multi-fields two dimensional code.

Abstract: The present invention provides systems and methods capable of collecting and analyzing a multi-fields two-dimensional code. A computer-implemented method of analyzing multi-fields two-dimensional code, comprises: receiving decoded multi-fields two dimensional code; identifying a first field and a second field from the decoded multi-fields two dimensional code; and determining whether the first field of the multi-fields two-dimensional code matches one of multiple pieces of pre-stored first information and whether the second field of the multi-fields two-dimensional code has ever been collected before, for providing a result with respect to the decoded multi-fields two dimensional code.

Abstract: The present invention provides systems and methods capable of collecting and analyzing a multi-fields two-dimensional code. A system in accordance with one embodiment of the present invention comprises at least one mobile terminal, a communication network and at least one server, wherein the at least one mobile terminal and the at least one server are both coupled to the communication network. The mobile terminal comprises a collecting module for collecting the multi-fields two dimensional code in an optical manner; a decoding module for decoding the collected multi-fields two dimensional code; and an identifying module for identifying the multiple fields by applying a predetermined rule. The server comprises a memory and an analyzing module for analyzing the multi-fields two-dimensional code. Other embodiments are also described.

Abstract: The present invention provides systems and methods capable of collecting and analyzing a multi-fields two-dimensional code. A system in accordance with one embodiment of the present invention comprises at least one mobile terminal, a communication network and at least one server, wherein the at least one mobile terminal and the at least one server are both coupled to the communication network. The mobile terminal comprises a collecting module for collecting the multi-fields two dimensional code in an optical manner; a decoding module for decoding the collected multi-fields two dimensional code; and an identifying module for identifying the multiple fields by applying a predetermined rule. The server comprises a memory and an analyzing module for analyzing the multi-fields two-dimensional code. Other embodiments are also described.