Patents by Inventor Kailash Venkatraman

Kailash Venkatraman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220275531
    Abstract: A method of electroplating a metal into features, having substantially different depths, of a partially fabricated electronic device on a substrate is provided. The method includes adsorbing accelerator into the bottom of recessed features; partially filling the features by a bottom up fill mechanism in an electroplating solution; diffusing leveler into shallow features to decrease the plating rate in shallow features as compared to deep features; and electroplating more metal into the features such that the height of metal in deep features is similar to the height of metal in shallow features.
    Type: Application
    Filed: July 22, 2020
    Publication date: September 1, 2022
    Applicant: Lam Research Corporation
    Inventors: Stephen J. Banik, Jacob Kurtis Blickensderfer, Kailash Venkatraman, Justin Oberst, Lee Peng Chua, Bryan L. Buckalew, Steven T. Mayer
  • Patent number: 11225714
    Abstract: A method is provided, including the following operations: depositing a liner in a feature of a substrate; depositing a monolayer of zinc over the liner; after depositing the monolayer of zinc, performing a thermal treatment on the substrate, wherein the thermal treatment is configured to cause migration of the zinc to an interface of the liner and an oxide layer of the substrate, the migration of the zinc producing an adhesive barrier at the interface that improves adhesion between the liner and the oxide layer of the substrate; repeating the operations of depositing the monolayer of zinc and performing the thermal treatment until a predefined number of cycles is reached.
    Type: Grant
    Filed: October 31, 2019
    Date of Patent: January 18, 2022
    Assignee: Lam Research Corporation
    Inventors: Kailash Venkatraman, Yezdi Dordi, Aniruddha Joi
  • Publication number: 20220011263
    Abstract: A sensor for detecting lead in an aqueous solution includes a copper working electrode, a counter electrode, a power supply for applying underpotential deposition of lead onto the copper electrode, a measuring device for providing measurement of a hydrogen evolution reaction (HER) current on the Pbupd-modified electrode, and a controller configured to correlate the degree of suppression of the HER current to Pbupd coverage to determine the lead coverage and lead concentration of the solution.
    Type: Application
    Filed: September 21, 2021
    Publication date: January 13, 2022
    Inventors: Rohan Akolkar, Xinyu Liu, Kailash Venkatraman
  • Patent number: 11125717
    Abstract: A sensor for detecting lead in an aqueous solution includes a copper working electrode, a counter electrode, a power supply for applying underpotential deposition of lead onto the copper electrode from the aqueous solution, a measuring device for providing measurement of a hydrogen evolution reaction (HER) current on the Pbupd-modified electrode, and a means for correlating the degree of suppression of the HER current to Pbupd coverage to determine the lead coverage and lead concentration of the solution.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: September 21, 2021
    Assignee: CASE WESTERN RESERVE UNIVERSITY
    Inventors: Rohan Akolkar, Xinyu Liu, Kailash Venkatraman
  • Patent number: 10640874
    Abstract: A method of performing electroless electrochemical atomic layer deposition is provided and includes: providing a substrate including an exposed upper metal layer; exposing the substrate to a first precursor solution to create a sacrificial metal monolayer on the exposed upper metal layer via underpotential deposition, where the first precursor solution is an aqueous solution including a reducing agent; subsequent to the forming of the sacrificial metal monolayer, rinsing the substrate; subsequent to the rinsing of the substrate, exposing the substrate to a second precursor solution to replace the sacrificial metal monolayer with a first deposition layer; and subsequent to replacing the sacrificial metal monolayer with the first deposition layer, rinsing the substrate. The exposure of the substrate to the first precursor solution and the exposure of the substrate to the second precursor solution are electroless processes.
    Type: Grant
    Filed: August 3, 2018
    Date of Patent: May 5, 2020
    Assignee: LAM RESEARCH CORPORATION
    Inventors: Aniruddha Joi, Kailash Venkatraman, Yezdi Dordi
  • Publication number: 20200063256
    Abstract: A method is provided, including the following operations: depositing a liner in a feature of a substrate; depositing a monolayer of zinc over the liner; after depositing the monolayer of zinc, performing a thermal treatment on the substrate, wherein the thermal treatment is configured to cause migration of the zinc to an interface of the liner and an oxide layer of the substrate, the migration of the zinc producing an adhesive barrier at the interface that improves adhesion between the liner and the oxide layer of the substrate; repeating the operations of depositing the monolayer of zinc and performing the thermal treatment until a predefined number of cycles is reached.
    Type: Application
    Filed: October 31, 2019
    Publication date: February 27, 2020
    Inventors: Kailash Venkatraman, Yezdi Dordi, Aniruddha Joi
  • Patent number: 10501846
    Abstract: A method is provided, including the following operations: depositing a ruthenium liner in a feature of a substrate; depositing a monolayer of zinc over the ruthenium liner; after depositing the monolayer of zinc, performing a thermal treatment on the substrate, wherein the thermal treatment is configured to cause migration of the zinc to an interface of the ruthenium liner and an oxide layer of the substrate, the migration of the zinc producing an adhesive barrier at the interface that improves adhesion between the ruthenium liner and the oxide layer of the substrate; repeating the operations of depositing the monolayer of zinc and performing the thermal treatment until a predefined number of cycles is reached.
    Type: Grant
    Filed: September 11, 2017
    Date of Patent: December 10, 2019
    Assignee: Lam Research Corporation
    Inventors: Kailash Venkatraman, Yezdi Dordi, Aniruddha Joi
  • Publication number: 20190227030
    Abstract: A sensor for detecting lead in an aqueous solution includes a copper working electrode, a counter electrode, a power supply for applying underpotential deposition of lead onto the copper electrode from the aqueous solution, a measuring device for providing measurement of a hydrogen evolution reaction (HER) current on the Pbupd-modified electrode, and a means for correlating the degree of suppression of the HER current to Pbupd coverage to determine the lead coverage and lead concentration of the solution.
    Type: Application
    Filed: January 23, 2019
    Publication date: July 25, 2019
    Inventors: Xinyu Liu, Kailash Venkatraman
  • Publication number: 20190078202
    Abstract: A method is provided, including the following operations: depositing a ruthenium liner in a feature of a substrate; depositing a monolayer of zinc over the ruthenium liner; after depositing the monolayer of zinc, performing a thermal treatment on the substrate, wherein the thermal treatment is configured to cause migration of the zinc to an interface of the ruthenium liner and an oxide layer of the substrate, the migration of the zinc producing an adhesive barrier at the interface that improves adhesion between the ruthenium liner and the oxide layer of the substrate; repeating the operations of depositing the monolayer of zinc and performing the thermal treatment until a predefined number of cycles is reached.
    Type: Application
    Filed: September 11, 2017
    Publication date: March 14, 2019
    Inventors: Kailash Venkatraman, Yezdi Dordi, Aniruddha Joi
  • Publication number: 20190048472
    Abstract: A method of performing electroless electrochemical atomic layer deposition is provided and includes: providing a substrate including an exposed upper metal layer; exposing the substrate to a first precursor solution to create a sacrificial metal monolayer on the exposed upper metal layer via underpotential deposition, where the first precursor solution is an aqueous solution including a reducing agent; subsequent to the forming of the sacrificial metal monolayer, rinsing the substrate; subsequent to the rinsing of the substrate, exposing the substrate to a second precursor solution to replace the sacrificial metal monolayer with a first deposition layer; and subsequent to replacing the sacrificial metal monolayer with the first deposition layer, rinsing the substrate. The exposure of the substrate to the first precursor solution and the exposure of the substrate to the second precursor solution are electroless processes.
    Type: Application
    Filed: August 3, 2018
    Publication date: February 14, 2019
    Inventors: Aniruddha Joi, Kailash Venkatraman, Yezdi Dordi