Abstract: The disclosure provides a three-dimensional (3D) memory, a method of fabricating a 3D memory and a memory system. The 3D memory can include a stack including alternately stacked first dielectric layers and conductive layers, and a channel structure extending through the stack and including a second dielectric layer and a blocking layer disposed in this order from outside to inside. The second dielectric layer can have a dielectric constant greater than or equal to 3.9.

Abstract: Disclosed are an electromagnetic shielding structure and a manufacturing method thereof, and an electronic product. The manufacturing method includes covering an injection mold on a circuit substrate, so that different circuit units on the circuit substrate are respectively accommodated in different injection molding cavities of the injection mold; injecting a non-conductive plastic sealant into the injection molding cavities so as to form non-conductive plastic sealing bodies on the circuit units, wherein spacing grooves are formed between the non-conductive plastic sealing bodies; and forming a conductive shielding layer on the non-conductive plastic sealing bodies, so that the conductive shielding layer covers the non-conductive plastic sealing bodies and fills the spacing grooves to form shielding barrier walls, thereby realizing shielding between the different circuit units in respective cavities.

Abstract: A method for preparation of a magnetic liquid metal includes: 1) placing A parts by weight of a liquid metal in a container; 2) placing B parts by weight of a metal powder in the container; 3) adding an acidic solution into the container until the liquid metal and the metal powder are submerged; 4) stirring until the liquid metal and the metal powder are sufficiently mixed; and 5) adding water for cleaning the acidic solution, and to obtain the magnetic liquid metal by removing the acidic solution. The viscosity and stiffness of the prepared magnetic liquid metal can quickly respond to the stimulus from an applied magnetic field, and a reversible change from liquid to semisolid or solid exists. With a change in magnetic field strengths, the Young's modulus can be regulated in a range from the level of kPa to the level of MPa.

Abstract: Disclosed are an electromagnetic shielding structure and a manufacturing method thereof, and an electronic product. The manufacturing method comprising the following steps: covering an injection mold on a circuit substrate, so that different circuit units on the circuit substrate are respectively accommodated in different injection molding cavities of the injection mold; injecting a non-conductive plastic sealant into the injection molding cavities so as to form non-conductive plastic sealing bodies on the circuit units, wherein spacing grooves are formed between the non-conductive plastic sealing bodies; and forming a conductive shielding layer on the non-conductive plastic sealing bodies, so that the conductive shielding layer covers the non-conductive plastic sealing bodies and fills the spacing grooves to form shielding barrier walls, thereby realizing shielding between the different circuit units in respective cavities.

Abstract: A wavelength selector (5) selects a wavelength of a broadband light source (4). A light director (BS1, BS2) directs light from the wavelength selector along a measurement path towards a region of a sample surface and along a reference path towards a reference surface, such that light reflected by the region of the sample surface and light reflected by the reference surface interfere to produce an interferogram. A controller (20) controls the wavelength selector to change the wavelength selected by the wavelength selector. A recorder (63) records successive images, each image representing the interferogram produced by a respective one of the wavelengths selected by the wavelength selector. A data processor (18, 180) processes the recorded images to produce at least one of a surface profile and a surface height map of at least a part of the sample surface. The reference path may be controlled to compensate for environmental effects such as vibration, thermal effects and air turbulence.

Abstract: The present invention discloses a wavelength scanning interferometer and a method for an aspheric surface measurement. The wavelength scanning interferometer comprises a set of tunable lasers (7) used as a light source, a Twyman-Green interferometer used for generating interference fringes, a translation platform (1) used for scanning an optical path difference along an optical axis, an image card (11) used for converting interference data to a digital signal and transmitting the digital signal to a computer (12), and a data card (13) used for synchronizing the actions of a CCD camera (9) and the translation platform (1). Different from the traditional aspheric surface measurement method, the interferometer is capable of measuring a surface with a high aspheric surface degree or a wavefront, and without the need of a zero compensation mirror. In addition, the method does not need a complex and usually expensive multi-dimensional movement platform.

Abstract: The present invention discloses a wavelength scanning interferometer and a method for an aspheric surface measurement. The wavelength scanning interferometer comprises a set of tunable lasers (7) used as a light source, a Twyman-Green interferometer used for generating interference fringes, a translation platform (1) used for scanning an optical path difference along an optical axis, an image card (11) used for converting interference data to a digital signal and transmitting the digital signal to a computer (12), and a data card (13) used for synchronizing the actions of a CCD camera (9) and the translation platform (1). Different from the traditional aspheric surface measurement method, the interferometer is capable of measuring a surface with a high aspheric surface degree or a wavefront, and without the need of a zero compensation mirror. In addition, the method does not need a complex and usually expensive multi-dimensional movement platform.

Abstract: A wavelength selector (5) selects a wavelength of a broadband light source (4). A light director (BS1, BS2) directs light from the wavelength selector along a measurement path towards a region of a sample surface and along a reference path towards a reference surface,such that light reflected by the region of the sample surface and light reflected by the reference surface interfere to produce an interferogram. A controller (20) controls the wavelength selector to change the wavelength selected by the wavelength selector. A recorder (63) records successive images,each image representing the interferogram produced by a respective one of the wavelengths selected by the wavelength selector. A data processor (18, 180) processes the recorded images to produce at least one of a surface profile and a surface height map of at least a part of the sample surface. The reference path may be controlled to compensate for environmental effects such as vibration, thermal effects and air turbulence.

Abstract: Light from the first and second different wavelength light sources is combined and supplied to a director that directs zeroth order light to a reference surface and other order, generally first order diffracted light to on a location of the sample surface which is dependent upon wavelength. Light reflected by the sample and reference surfaces interfere. A characteristic of a sample surface is determined from interference light of the first wavelength. Interference light of the second wavelength is used to enable phase-locking by adjusting the path length difference by moving the reference surface or changing the refractive index of a path portion to compensate for phase variation due to environmental effects. Non-mechanical scanning is used to scan the sample surface by using a variable wavelength source and a director providing different first order diffraction angles for different wavelengths or an acousto-optical device that provides a variable pitch acoustic diffraction grating.

Abstract: Light from the first and second different wavelength light sources is combined and supplied to a director that directs zeroth order light to a reference surface and other order, generally first order diffracted light to on a location of the sample surface which is dependent upon wavelength. Light reflected by the sample and reference surfaces interfere. A characteristic of a sample surface is determined from interference light of the first wavelength. Interference light of the second wavelength is used to enable phase-locking by adjusting the path length difference by moving the reference surface or changing the refractive index of a path portion to compensate for phase variation due to environmental effects. Non-mechanical scanning is used to scan the sample surface by using a variable wavelength source and a director providing different first order diffraction angles for different wavelengths or an acousto-optical device that provides a variable pitch acoustic diffraction grating.