Abstract: A memory device includes a memory array comprising a plurality of memory cells, and control circuitry coupled to the memory array. The control circuitry comprises at least one dummy memory cell, a feedback-based controller having inputs coupled to respective internal nodes of the dummy memory cell, and write signal generation circuitry coupled to the feedback-based controller and configured to provide one or more write signals for controlling writing of data to portions of the memory array. The feedback-based controller generates a reset signal for application to a reset input of the write signal generation circuitry at least in part as a function of a logic level transition delay of a selected one of the first and second internal nodes of the dummy memory cell.

Abstract: A memory includes a self-timed column imitating a bitline loading, a self-timed row imitating a self-timed word-line, a self-timed bitcell performing a dummy write in a write cycle, a writer driver coupled to the self-timed bitcell for an actual write, and an edge detection circuit coupled to the self-timed bitcell for tracking a write cycle time.

Abstract: In embodiments of the invention, a memory circuit includes a static random access memory (SRAM), rows of M sense amplifiers, a global read precharge tracking control circuit controlling a precharge of global read lines, a sense amplifier output tracking circuit generating a reset sense amplifier signal for the sense amplifier control circuits, and a read delay circuit generating a trigger signal for the global read precharge tracking control circuit and the sense amplifier output tracking circuit and performing a fixed delay tracking of a read operation in a read cycle. A dummy global read line is coupled to the global read precharge tracking control circuit and returns from a half way to the top of the SRAM forming a tracking dummy global read line that determines a completion of the precharge of the global read lines before the sense amplifiers start discharging the global read lines in the read cycle.

Abstract: In described embodiments, a memory circuit includes a static random access memory (SRAM) including N banks of memory cells, rows of M sense amplifiers, a controlled feedback latch storing a previous state of input data in a read cycle, a pull down select block coupled to the controlled feedback latch and the dummy sense amplifier, a dummy output latch coupled to the pull-down select block to store the read data, and a SRAM reset generation circuit coupled to the sense amplifier control circuits and the controlled feedback latch. The dummy output latch is a latch that is the same as a sense amplifier latch used in the local input/output circuit, thereby, no margin is involved between a reset of the sense amplifiers and the read data latched at the dummy output latch in the read cycle.

Abstract: In described embodiments, a memory circuit includes a static random access memory (SRAM) including N banks of memory cells, rows of M sense amplifiers, a controlled feedback latch storing a previous state of input data in a read cycle, a pull down select block coupled to the controlled feedback latch and the dummy sense amplifier, a dummy output latch coupled to the pull-down select block to store the read data, and a SRAM reset generation circuit coupled to the sense amplifier control circuits and the controlled feedback latch. The dummy output latch is a latch that is the same as a sense amplifier latch used in the local input/output circuit, thereby, no margin is involved between a reset of the sense amplifiers and the read data latched at the dummy output latch in the read cycle.

Abstract: In embodiments of the invention, a memory circuit includes a static random access memory (SRAM), rows of M sense amplifiers, a global read precharge tracking control circuit controlling a precharge of global read lines, a sense amplifier output tracking circuit generating a reset sense amplifier signal for the sense amplifier control circuits, and a read delay circuit generating a trigger signal for the global read precharge tracking control circuit and the sense amplifier output tracking circuit and performing a fixed delay tracking of a read operation in a read cycle. A dummy global read line is coupled to the global read precharge tracking control circuit and returns from a half way to the top of the SRAM forming a tracking dummy global read line that determines a completion of the precharge of the global read lines before the sense amplifiers start discharging the global read lines in the read cycle.

Abstract: A memory includes a self-timed column imitating a bitline loading, a self-timed row imitating a self-timed word-line, a self-timed bitcell performing a dummy write in a write cycle, a writer driver coupled to the self-timed bitcell for an actual write, and an edge detection circuit coupled to the self-timed bitcell for tracking a write cycle time.

Abstract: A memory device includes a memory array comprising a plurality of memory cells, and control circuitry coupled to the memory array. The control circuitry comprises at least one dummy memory cell, a feedback-based controller having inputs coupled to respective internal nodes of the dummy memory cell, and write signal generation circuitry coupled to the feedback-based controller and configured to provide one or more write signals for controlling writing of data to portions of the memory array. The feedback-based controller generates a reset signal for application to a reset input of the write signal generation circuitry at least in part as a function of a logic level transition delay of a selected one of the first and second internal nodes of the dummy memory cell.