Patents by Inventor Kamel Amara

Kamel Amara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical coupling device for single mode optical fibers
    Patent number: 7054511
    Abstract: A device for coupling incident radiation to a single mode fiber optic a solid state interferormeter having a front end similar to a Mach-Zehnder integrated interferometer and a back end formed by two converging radiation channels converging at an angle ? and terminating prior to overlapping. The angle ? is calculated to produce an interference zone formed by the exiting radiation a primary constructive interference fringe that provides an optimum match to an input fiber mode of a fiber positioned within the interference zone.
    Type: Grant
    Filed: October 3, 2003
    Date of Patent: May 30, 2006
    Assignee: Applied Optical Center of Delaware, Inc.
    Inventors: Noureddine Melikechi, Kamel Amara
  • Interferometric analog optical modulator for single mode fibers
    Publication number: 20040179764
    Abstract: A device for simultaneously coupling and modulating incident radiation to a single mode optical fiber based on a solid state truncated integrated Mach-Zehnder interferometer having a back end formed by two converging radiation channels converging at an angle &thgr; and terminating prior to overlapping. The angle &thgr; is calculated to produce in an interference zone formed by the exiting radiation a primary constructive interference fringe that provides an optimum match to an input fiber mode of a fiber positioned within the interference zone. Phase shifting elements in the radiation propagation paths provide a linear shift of the constructive interference fringe across the input of the fiber optic in response to an analog signal.
    Type: Application
    Filed: October 3, 2003
    Publication date: September 16, 2004
    Inventors: Noureddine Melikechi, Kamel Amara, William D. Jamison
  • Optical coupling device for single mode optical fibers
    Publication number: 20040179781
    Abstract: A device for coupling incident radiation to a single mode fiber optic a solid state interferormeter having a front end similar to a Mach-Zehnder integrated interferometer and a back end formed by two converging radiation channels converging at an angle &thgr; and terminating prior to overlapping. The angle &thgr; is calculated to produce an interference zone formed by the exiting radiation a primary constructive interference fringe that provides an optimum match to an input fiber mode of a fiber positioned within the interference zone.
    Type: Application
    Filed: October 3, 2003
    Publication date: September 16, 2004
    Inventors: Noureddine Melikechi, Kamel Amara
  • Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films
    Patent number: 6731380
    Abstract: A beam deflection technique for simultaneous measurements of the thickness, refractive index and optical absorption of transparent materials using a charge coupled device (CCD) camera is provided. The method comprises measuring beam deflection after transmission through or reflection off a sample of interest at variable incidence angles to the sample surface. The measurement of beam deflection as a function of incident angle is related through Snell's Law directly to the sample thickness and sample index of refraction.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: May 4, 2004
    Assignee: Applied Optics Center of Delaware, Inc.
    Inventors: Mohamed Kamel Amara, Noureddine Melikechi, Sabbir M. Mian
  • Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films
    Publication number: 20030025899
    Abstract: A beam deflection technique for simultaneous measurements of the thickness, refractive index and optical absorption of transparent materials using a charge coupled device (CCD) camera is provided. The method comprises measuring beam deflection after transmission through or reflection off a sample of interest at variable incidence angles to the sample surface. The measurement of beam deflection as a function of incident angle is related through Snell's Law directly to the sample thickness and sample index of refraction.
    Type: Application
    Filed: June 18, 2001
    Publication date: February 6, 2003
    Inventors: Mohamed Kamel Amara, Noureddine Melikechi, Shabbir M. Mian