Patents by Inventor Kamil S. Salloum

Kamil S. Salloum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe tip formation for die sort and test
    Patent number: 9823273
    Abstract: Probe tip formation is described for die sort and test. In one example, the tips of wires of a test probe head are prepared for use as test probes. The wires are attached to a test probe head substrate. The end opposite the substrate has a tip. The tips of the wires are polished when attached to the test probe head to form a sharpened point.
    Type: Grant
    Filed: June 29, 2013
    Date of Patent: November 21, 2017
    Assignee: Intel Corporation
    Inventors: Keith J. Martin, Kip P. Stevenson, Kamil S. Salloum, Todd P. Albertson
  • PROBE TIP FORMATION FOR DIE SORT AND TEST
    Publication number: 20150002181
    Abstract: Probe tip formation is described for die sort and test. In one example, the tips of wires of a test probe head are prepared for use as test probes. The wires are attached to a test probe head substrate. The end opposite the substrate has a tip. The tips of the wires are polished when attached to the test probe head to form a sharpened point.
    Type: Application
    Filed: June 29, 2013
    Publication date: January 1, 2015
    Inventors: Keith J. Martin, Kip P. Stevenson, Kamil S. Salloum, Todd P. Albertson