Abstract: Testing system includes a testing device and a testing circuit board connected to the testing device. The testing device includes a storing module, a transmit-receive module, and an analyzing module. A number of specification parameters of a fan module is stored in the storing module. The transmit-receive module sends a testing code to the testing circuit board. The testing circuit board responds to the testing code to detect a number of running information of the fan module, and sends the running information to the transmit-receive module. The analyzing module receives the number of running information from the transmit-receive module and compares the number of running information with the number of specification parameters for determining whether the fan is qualified. The disclosure further provides a testing method.

Abstract: A simulation testing system is used to test power consumption of an electronic device including a plurality of electronic components. The simulation testing system includes a power supply unit, a main controller connected to the power supply unit, and a simulation system comprising a plurality of heating resistors arranged in a matrix. Each of plurality of heating resistor is connected to the power supply unit via a switch controlled by the main controller. The main controller turns on a number of the switches to power on the number of the plurality of heating resistors and to simulate a plurality of electronic components of the electronic device.

Abstract: In a server management method, a blade server system including a plurality of blade servers is connected to a monitor device in series. The monitor device sends a command to the server system to control the plurality of blade servers. The plurality of blade servers responds to the command. The monitor device receives information from the server system to monitor and control the plurality of blade servers. A server monitor system associated with the server monitor method is also disclosed.

Abstract: A driving assistant system includes a plurality of cameras configured to capture wide-angle views around a vehicle; a monitor, a Field-Programmable Gate Array (FPGA) connected to the plurality of cameras, and a digital signal processor connected to the FPGA and the monitor. The FPGA converts the wide-angle images to flat plane images. The digital signal processor combines the plane images into a single panoramic image and sends the panoramic image to the monitor. The monitor displays the panoramic image, to assist the driver by eliminating any blind spots. The present disclosure further discloses a driving assistant method based upon the above driving assistant system.

Abstract: A driving assistant system comprises a plurality of cameras configured to capture pictures around a vehicle in different positions and directions and a monitor to display the pictures. The driving assistant system further comprises a FPGA connected to the plurality of cameras. The FPGA combines the pictures into a panorama picture and send the panorama picture to the monitor which displays the panorama picture. The present disclosure further discloses a driving assistant method based upon the above driving assistant system.

Abstract: A driving assistant system comprises a plurality of cameras configured to capture images around a vehicle, a monitor capable of displaying the images, and a Field-Programmable Gate Array (FPGA) connected to the plurality of cameras. The plurality of cameras comprising a first camera attached to a front central portion of the vehicle, a second camera attached to a first rearview mirror of the vehicle, a third camera attached to a second rearview mirror of the vehicle, and a fourth camera attached to a rear central portion of the vehicle. The FPGA is capable of combining the images into a panorama image and sending the panorama image to the monitor which displays the panorama image. The present disclosure further discloses a driving assistant method based upon the above driving assistant system.

Abstract: An electronic device testing system is configured to test an electronic device which generates a plurality of signals while running. The electronic device testing system includes a programmable logic device (PLD) configured to monitor and control the electronic device and a computer connected to the PLD. The PLD includes a read/write control module connected to the electronic device and a controller connected to the read/write control module. The read/write control module reads the plurality of signals generated by the electronic device. The controller determines whether the plurality of signals has errors and sends error signals to the computer. The computer analyzes the error signals and displays problems associated with the error signals. The present disclosure further discloses an electronic device testing method based upon the above testing system.

Abstract: A fan module test system includes a control device, a switch unit, a wind speed sensor, and a micro control unit. The control device outputs test instructions. The switch unit receives the test instructions, and controls a fan to rotate at a rotational speed according to the test instructions. The wind speed sensor detects a wind speed. The switch unit collects rotational speed signals and wind speed signals. The micro control unit receives the rotational speed signals and the wind speed signals, and transmits the rotational speed signals and the wind speed signals to the control device. The control device determines whether the fan meets heat dissipation requirements according to the rotational speed signals and the wind speed signals.

Abstract: A system analyzing system includes a field programmable gate array, a complex programmable logic device electrically connected to the field programmable gate array, a micro control unit electrically connected to the field programmable gate array and a display module electrically connected to micro control unit. The complex programmable logic device and the micro control unit control the field programmable gate array to be powered on/powered off and the field programmable gate array saves the sequence of times when the field programmable gate array is powered on/powered off and displaying the time sequence on the display module, and the micro control unit is capable of receiving a command and sending the command to the field programmable gate array to execute from the display module.

Abstract: A signal monitor includes a signal collecting unit, two registers, a processing unit, and a Universal Asynchronous Receiver/Transmitter (UART). The signal collecting unit collects real-time signals from a bus, converts the real-time signals into accessible data, and stores the accessible data in the two registers. The processing unit reads the accessible data from the two registers and determines status of the real-time signals by examining the accessible data in the reading. The UART asynchronously transmits the status of the real-time signals to a control terminal. A method for monitoring signals transmitted in a bus is also provided.

Abstract: A signal monitor includes a signal collecting unit, a register, a processing unit, and a Reduced Media Independent Interface (RMII). The signal collecting unit collects real-time signals from a bus, converts the real-time signals into accessible data, and stores the accessible data in the register. The processing unit retrieves the accessible data from the register and determines status of the real-time signals by examining the accessible data. The RMII converts the status of the real-time signals into Ethernet frame packets and transmits the Ethernet frame packets to a control terminal via an Ethernet interface. A method for monitoring signals transmitted in a bus is also provided.

Abstract: A system for processing signals includes an original wave outputting module, a signal sampling module and a signal processing module. The signal processing module includes an SCM, an FGPA chip and an amplifier electrically connected to the SCM. The original wave outputting module outputs an originating wave. The signal sampling module samples the wave, and outputs a plurality of signals. The signal processing module receives the plurality of signals, and outputs an amplified wave. The SCM has a predetermined wave frequency value and a predetermined wave amplitude value. The FGPA chip generates digital signals according to the predetermined wave frequency value. The amplifier amplifies the digital signals according to the predetermined wave amplitude value.

Abstract: A monitor and control system includes a server model, a number of switches, a temperature sensor mounted in the server model, a monitor and control device, and a microcontroller. The switches are connected to the resistors to control current through the resistors. The temperature sensor is mounted in the server model. The monitor and control device is connected to the server model and configured to monitor and control the server model. The microcontroller is configured to switch the switches on and off and send temperature information sensed by the temperature sensor to the monitor and control device.

Abstract: A system for monitoring server simulated loads includes a fan, a switch module, a server chassis, a temperature sensor, and a micro control unit (MCU). The load module includes a plurality of heating loads. The switch module includes a plurality of switches, each of which is connected to one of the plurality of heating loads. The fan, the load module, and the switch module are housed in the server chassis. The temperature sensor detects an interior temperature of the server chassis. The MCU controls the switch module to turn on/off one or more loads of the plurality of heating loads, and/or adjusts a rotation speed of the fan, and determines whether the interior temperature exceeds a predetermined threshold. A method for monitoring server simulated loads is also disclosed.

Abstract: A system for processing signals includes an original wave outputting module, a signal sampling module and a signal processing module. The signal processing module includes an SCM, an FGPA chip and an amplifier electrically connected to the SCM. The original wave outputting module outputs an originating wave. The signal sampling module samples the wave, and outputs a plurality of signals. The signal processing module receives the plurality of signals, and outputs an amplified wave. The SCM has a predetermined wave frequency value and a predetermined wave amplitude value. The FGPA chip generates digital signals according to the predetermined wave frequency value. The amplifier amplifies the digital signals according to the predetermined wave amplitude value.

Abstract: A test system for Light-emitting diodes (LEDs) includes a microcontroller, a plurality of light sensors, a plurality of shielding members and a display module. Each of the plurality of light sensors is connected to the microcontroller and each of LEDs. Each of the plurality of light sensors is capable of detecting luminance of the plurality of LEDs respectively. Each of the plurality of shielding members is configured to prevent light outside of each of the plurality of shielding members from interfering with light emitted from each of the LEDs inside of each of the plurality of shielding members. The microcontroller is adapted to read light intensities sensed by the plurality of light sensors according to a predetermined sequence and send the light intensities to the display module to display the light intensities in the predetermined sequence.

Abstract: A luminance test system includes a plurality of LEDs, a microcontroller, a plurality of light sensors, a plurality of shielding members, a plurality of AD converters, a MCU and a display module. Each of the plurality of light sensors detects a luminance of one of the plurality of LEDs to generate an analog luminance signal. Each of the shielding members receives one of the plurality of LEDs and one of the plurality of light sensors. Each of the plurality AD converters converts the analog luminance signal into a digital luminance signal. The plurality of AD converters in turn transmit the digital luminance signal to the MCU. The display module displays a luminance value of each of the plurality of LEDs according to the digital luminance signal.

Abstract: A testing system for testing an under test electronic device, includes an error capturing and latching unit, a storage unit, and a control terminal. The error capturing and latching unit detects and captures running error signals of the under test electronic device. The storage unit stores the running error signals. The control terminal is connected to the storage unit. The control terminal picks out the running error signals from the storage unit and analyzes these signals.

Abstract: A debug system includes a debug device and a computer. The debug device includes a decoding module, a first storing module, a first control module; and a signal receiving and transmitting module. The computer includes a second control module, a second storing module, and a display module. The decoding module decodes data from the LPC bus. The first storing module stores decoded data. The second control module sends a set address data to the first control module via the signal receiving and transmitting module. The first control module obtains a corresponding data from the first storing module according to the set address data and send the corresponding data to the second control module via the signal receiving and transmitting module. The second control module stores the corresponding data to the second storing module and displays the corresponding data on the display module.

Abstract: A debug system includes a debug device and a computer. The debug device includes an SPI reading and writing module, a first control module, a detecting module, and a signal receiving and transmitting module. The computer includes a second control module and a display module. The SPI reading and writing module is connected to an SPI device. The second control module sends an inputted write command to the first control module. The first control module writes data to the SPI device according to the inputted write command. The detecting module sends a fail signal to the first control module after detecting that the data is not written to the SPI device and a written times of the data is greater than a predetermined times. The first control module sends the fail signal to the second control module. The second control module displays the fail signal on the display module.