Abstract: A method includes moving data in a defect range from a defective area of a data storage medium to a reserve area of the data storage medium, and identifying the defect range by an address of a start of the defect range and a defect length. A logical address table is updated with the address of the start of the defect range, the defect length and an offset to the reserve area.

Abstract: A method includes detecting a read error during a first read operation by a read sensor on a first track on a data storage medium. The method also includes, after the read error is detected, performing a second read operation by the read sensor on the first track, carrying out bit error value (BEV) measurements for the second read operation, and determining, from the BEV measurements, whether the read sensor produces a marginal BEV, which is between first and second predetermined BEV thresholds. In response to determining that the read sensor produces the marginal BEV, a third read operation by the read sensor on the first track is carried out, and BEV measurements for the third read operation are performed. When the BEV measurements from the second and third read operations meet at least one predetermined read sensor instability criterion, it is concluded that the read sensor is unstable.

Abstract: A method includes moving data in a defect range from a defective area of a data storage medium to a reserve area of the data storage medium, and identifying the defect range by an address of a start of the defect range and a defect length. A logical address table is updated with the address of the start of the defect range, the defect length and an offset to the reserve area.

Abstract: This disclosure is related to systems and methods for temperature monitoring of electronics, such as a controller or processor within a data storage device. In one example, a controller may be configured to determine an operation to perform and determine a temperature of electronics associated with executing the operation. The controller may then delay execution of the operation when the temperature is greater than a threshold.

Abstract: This disclosure is related to systems and methods for temperature monitoring of electronics, such as a controller or processor within a data storage device. In one example, a controller may be configured to determine an operation to perform and determine a temperature of electronics associated with executing the operation. The controller may then delay execution of the operation when the temperature is greater than a threshold.

Abstract: This disclosure is related to systems and methods for temperature monitoring of electronics, such as a controller or processor within a data storage device. In one example, a controller may be configured to determine an operation to perform and determine a temperature of electronics associated with executing the operation. The controller may then delay execution of the operation when the temperature is greater than a threshold.

Abstract: A multi-stage tracking control system includes at least a main actuator and a microactuator. The tracking control system is switched to a single-stage mode so that the main actuator alone provides tracking. A disturbance signal is applied to the microactuator while in the single-stage mode, and a failure condition of the microactuator is determined based on a position error generated in response to the disturbance signal.

Abstract: A multi-stage tracking control system includes at least a main actuator and a microactuator. The tracking control system is switched to a single-stage mode so that the main actuator alone provides tracking. A disturbance signal is applied to the microactuator while in the single-stage mode, and a failure condition of the microactuator is determined based on a position error generated in response to the disturbance signal.

Abstract: This disclosure is related to systems and methods for temperature monitoring of electronics, such as a controller or processor within a data storage device. In one example, a controller may be configured to determine an operation to perform and determine a temperature of electronics associated with executing the operation. The controller may then delay execution of the operation when the temperature is greater than a threshold.