Abstract: A virtual device acquires a transaction history between a legacy computing device and a linked device; obtains a first request provided from the legacy computing device based on the transaction history and a first response received from the linked device in response to the first request; receives a second request corresponding to the first request from a new computing device and determines a second response to the second request; and provides test information for the new computing device based on a comparison of the first response and the second response.

Abstract: A virtual device acquires a transaction history between a legacy computing device and a linked device; obtains a first request provided from the legacy computing device based on the transaction history and a first response received from the linked device in response to the first request; receives a second request corresponding to the first request from a new computing device and determines a second response to the second request; and provides test information for the new computing device based on a comparison of the first response and the second response.

Abstract: A method for testing an IT system automatically, when it comes to testing based on real transaction data including: (a) obtaining a transaction message by capturing a network packet transmitted and received between a user system and a transaction processing system; (b) transmitting a request data included in the transaction message to the system under test; (c) receiving a response data from the system under test; and (d) comparing the response data received from the system under test and a response data included in the transaction message and determining success or failure, is provided.

Abstract: An ultrasound diagnostic apparatus of the disclosure includes a probe; an ultrasound transceiver configured to transmit an ultrasound signal to an object through the probe and receive an echo signal reflected from the object; a controller configured to obtain first data by controlling the ultrasound transceiver to transmit a first ultrasound pulse to the object and receive the echo signal reflected from the object, to obtain second data by controlling the ultrasound transceiver to repeat an operation of transmitting a second ultrasound pulse different from the first ultrasound pulse to a first position of the object and receiving the echo signal reflected from the first position of the object a plurality of times at predetermined time intervals, to obtain third data by controlling the ultrasound transceiver to repeat an operation of transmitting the second ultrasound pulse to a second position of the object and receiving the echo signal reflected from the second position of the object the plurality of times a

Abstract: According to an embodiment of the present invention, a method for testing an IT system automatically, when it comes to testing based on real transaction data, comprising: (a) obtaining a transaction message by capturing a network packet transmitted and received between a user system and a transaction processing system; (b) transmitting a request data included in the transaction message to the system under test; (c) receiving a response data from the system under test; and (d) comparing the response data received from the system under test and a response data included in the transaction message and determining success or failure, is provided.

Abstract: A wafer guide for preventing a wafer breakage in a semiconductor cleaning apparatus includes a lower supporter, side supporters, fixing units and stoppers. The lower supporter is provided with a plurality of slots formed with the same interval in a length direction to vertically stand a plurality of wafers thereon. The side supporters are structured and arranged in parallel at each side above the lower supporter. The side supporters support side end parts of the wafers. The fixing units are adapted to support both end parts of the lower supporter and the side supporters, and may be fixed to a bath. The stoppers are individually coupled to each of the fixing units. The stoppers are operable to generate an error in a close operation of holder units of the robot chuck when the robot chuck deviates from a normal alignment range, so as not to perform a wafer chucking, thereby preventing a wafer breakage during the wafer chucking.

Abstract: A wafer guide for preventing a wafer breakage in a semiconductor cleaning apparatus includes a lower supporter, side supporters, fixing units and stoppers. The lower supporter is provided with a plurality of slots formed with the same interval in a length direction to vertically stand a plurality of wafers thereon. The side supporters are structured and arranged in parallel at each side above the lower supporter. The side supporters support side end parts of the wafers. The fixing units are adapted to support both end parts of the lower supporter and the side supporters, and may be fixed to a bath. The stoppers are individually coupled to each of the fixing units. The stoppers are operable to generate an error in a close operation of holder units of the robot chuck when the robot chuck deviates from a normal alignment range, so as not to perform a wafer chucking, thereby preventing a wafer breakage during the wafer chucking.