Patents by Inventor Kang-Hee Han

Kang-Hee Han has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240427305
    Abstract: A method of inspecting a programmable logic controller (PLC) control logic using a graphic neural network (GNN) generally includes three operations: a data preprocessing operation for a GNN, an operation of predicting whether tags are connected, and an operation of verifying suitability of edge connections between tags. As a result, a graph is generated from a PLC control logic and input to a link prediction model to find an incorrect connection in the PLC control logic. Subsequently, a result graph output through the link prediction is input to a trained model to verify edge connection suitability between tags. Then, it may be finally verified whether tags are connected in the PLC control logic.
    Type: Application
    Filed: November 12, 2021
    Publication date: December 26, 2024
    Applicant: UDMTEK CO., LTD.
    Inventors: Gi Nam Wang, Jun Pyo Park, Sang Chul Yoo, Kang Hee Han, Seung Woo Han, Yeon Dong Kim, Nam Ki Kim
  • Publication number: 20240168450
    Abstract: The present disclosure discloses a method of generating a master state that is a normal state in a repeated cycle by analyzing log data output from a programmable logic controller (PLC). In addition, a method of generating log data as graph data as data preprocessing for generating a master state is disclosed. The method of generating a master pattern and the method of training a cycle analysis model according to the present disclosure are different from the related art in that the methods are a technology of processing a machine control language (low-level language) that is difficult for humans to analyze and converting the machine control language into an analyzable language (high-level language), i.e., a machine language processing (MLP)-based technology that analyzes the executed machine language (a language that controls a machine) with a computer and can be understood by humans.
    Type: Application
    Filed: November 12, 2021
    Publication date: May 23, 2024
    Applicant: UDMTEK
    Inventors: Gi Nam Wang, Jun Pyo Park, Seung Woo Han, Kang Hee Han, Min Young Jung, Sang Chul Yoo, Geun Ho Yu
  • Patent number: 11693750
    Abstract: A virtual device acquires a transaction history between a legacy computing device and a linked device; obtains a first request provided from the legacy computing device based on the transaction history and a first response received from the linked device in response to the first request; receives a second request corresponding to the first request from a new computing device and determines a second response to the second request; and provides test information for the new computing device based on a comparison of the first response and the second response.
    Type: Grant
    Filed: December 21, 2021
    Date of Patent: July 4, 2023
    Assignee: LG CNS CO. LTD.
    Inventors: Minji Kim, Do Yeon Kim, Yong Sik Kim, Jung Hwan Kim, Jin Ho Kim, Kyungbae Sohn, Minsung Shin, Kang Hee Han, Heedae Hong
  • Publication number: 20220206913
    Abstract: A virtual device acquires a transaction history between a legacy computing device and a linked device; obtains a first request provided from the legacy computing device based on the transaction history and a first response received from the linked device in response to the first request; receives a second request corresponding to the first request from a new computing device and determines a second response to the second request; and provides test information for the new computing device based on a comparison of the first response and the second response.
    Type: Application
    Filed: December 21, 2021
    Publication date: June 30, 2022
    Inventors: Minji KIM, Do Yeon Kim, Yong Sik Kim, Jung Hwan Kim, Jin Ho Kim, Kyungbae Sohn, Minsung Shin, Kang Hee Han, Heedae Hong
  • Patent number: 11093367
    Abstract: A method for testing an IT system automatically, when it comes to testing based on real transaction data including: (a) obtaining a transaction message by capturing a network packet transmitted and received between a user system and a transaction processing system; (b) transmitting a request data included in the transaction message to the system under test; (c) receiving a response data from the system under test; and (d) comparing the response data received from the system under test and a response data included in the transaction message and determining success or failure, is provided.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: August 17, 2021
    Assignee: LG CNS Co., Ltd.
    Inventors: Yong Sik Kim, Jung Hwan Kim, Jin Ho Kim, Min Sung Shin, Hoil Lee, Kwang Ok Jang, Ki Chang Jung, Kang Hee Han
  • Publication number: 20210219958
    Abstract: An ultrasound diagnostic apparatus of the disclosure includes a probe; an ultrasound transceiver configured to transmit an ultrasound signal to an object through the probe and receive an echo signal reflected from the object; a controller configured to obtain first data by controlling the ultrasound transceiver to transmit a first ultrasound pulse to the object and receive the echo signal reflected from the object, to obtain second data by controlling the ultrasound transceiver to repeat an operation of transmitting a second ultrasound pulse different from the first ultrasound pulse to a first position of the object and receiving the echo signal reflected from the first position of the object a plurality of times at predetermined time intervals, to obtain third data by controlling the ultrasound transceiver to repeat an operation of transmitting the second ultrasound pulse to a second position of the object and receiving the echo signal reflected from the second position of the object the plurality of times a
    Type: Application
    Filed: January 19, 2021
    Publication date: July 22, 2021
    Inventors: Kang Sik Kim, Jung Ho Kim, Yang Mo Yoo, Jin Bum Kang, Kang Hee Han
  • Publication number: 20200192786
    Abstract: According to an embodiment of the present invention, a method for testing an IT system automatically, when it comes to testing based on real transaction data, comprising: (a) obtaining a transaction message by capturing a network packet transmitted and received between a user system and a transaction processing system; (b) transmitting a request data included in the transaction message to the system under test; (c) receiving a response data from the system under test; and (d) comparing the response data received from the system under test and a response data included in the transaction message and determining success or failure, is provided.
    Type: Application
    Filed: December 13, 2019
    Publication date: June 18, 2020
    Inventors: Yong Sik KIM, Jung Hwan KIM, Jin Ho KIM, Min Sung SHIN, Hoil LEE, Kwang OK JANG, Ki Chang JUNG, Kang Hee HAN
  • Patent number: 8033401
    Abstract: A wafer guide for preventing a wafer breakage in a semiconductor cleaning apparatus includes a lower supporter, side supporters, fixing units and stoppers. The lower supporter is provided with a plurality of slots formed with the same interval in a length direction to vertically stand a plurality of wafers thereon. The side supporters are structured and arranged in parallel at each side above the lower supporter. The side supporters support side end parts of the wafers. The fixing units are adapted to support both end parts of the lower supporter and the side supporters, and may be fixed to a bath. The stoppers are individually coupled to each of the fixing units. The stoppers are operable to generate an error in a close operation of holder units of the robot chuck when the robot chuck deviates from a normal alignment range, so as not to perform a wafer chucking, thereby preventing a wafer breakage during the wafer chucking.
    Type: Grant
    Filed: September 12, 2008
    Date of Patent: October 11, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hea-Woong Lee, Chang-Gil Ryu, Byoung-Moon Yoon, Yong-Myung Jun, Kang-Hee Han
  • Publication number: 20090067960
    Abstract: A wafer guide for preventing a wafer breakage in a semiconductor cleaning apparatus includes a lower supporter, side supporters, fixing units and stoppers. The lower supporter is provided with a plurality of slots formed with the same interval in a length direction to vertically stand a plurality of wafers thereon. The side supporters are structured and arranged in parallel at each side above the lower supporter. The side supporters support side end parts of the wafers. The fixing units are adapted to support both end parts of the lower supporter and the side supporters, and may be fixed to a bath. The stoppers are individually coupled to each of the fixing units. The stoppers are operable to generate an error in a close operation of holder units of the robot chuck when the robot chuck deviates from a normal alignment range, so as not to perform a wafer chucking, thereby preventing a wafer breakage during the wafer chucking.
    Type: Application
    Filed: September 12, 2008
    Publication date: March 12, 2009
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hea-Woong LEE, Chang-Gil RYU, Byoung-Moon YOON, Yong-Myung JUN, Kang-Hee HAN