Patents by Inventor Kang-Hyuk Kwon

Kang-Hyuk Kwon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8422028
    Abstract: The present invention relates to a scanning microscope using an I/Q-interferometer. The scanning microscope includes an I/Q-interferometer which demodulates the phase change and amplitude change induced on the probe beam to provide the I- and Q-signals, an XY scanner, a scanner driver, a precision motion stage controlling the displacement of the sample along the direction parallel to the direction of the probe beam, a motion stage driver, a focusing/collimating device, and a computer. The computer transfers control commands to the scanner driver for scanning the XY scanner, receives I- and Q-signal provided from the I/Q-interferometer, processes the I- and Q-signal to obtain the corresponding phase and amplitude values at each scanning point, calculates error signal for maintaining constant phase during the scanning, and transfers commands to the motion stage driver for the precision motion stage to compensate for phase changes caused by surface morphology during the scanning.
    Type: Grant
    Filed: July 2, 2010
    Date of Patent: April 16, 2013
    Assignee: Industry-University Cooperation Foundation Sogang University
    Inventors: Kyu-Man Cho, Kang-Hyuk Kwon
  • Patent number: 8405835
    Abstract: The present invention relates to a scanning microscope using a heterodyne interferometer, which can be used for mapping or imaging complex optical parameters such as physical structures and material properties of a sample under test. The heterodyne interferometer is designed to provide in- and quadrature-phase interference signal which can be used for extracting the phase and amplitude change induced on the probe beam. The phase and the amplitude of the probe beam, which is reflected from or transmitted through the sample, are modified by the physical structures and material properties of the sample. Therefore, by scanning the probe beam, local variations of the phase and amplitude can be mapped, and, thereby, three-dimensional microscopic physical structures and material properties can be imaged by processing the phase and amplitude values.
    Type: Grant
    Filed: January 29, 2010
    Date of Patent: March 26, 2013
    Assignee: Industry-University Cooperation Foundation Sogang University
    Inventors: Kyuman Cho, Kang-Hyuk Kwon
  • Publication number: 20100290061
    Abstract: The present invention relates to a scanning microscope using an I/Q-interferometer. The scanning microscope includes an I/Q-interferometer which demodulates the phase change and amplitude change induced on the probe beam to provide the I- and Q-signals, an XY scanner, a scanner driver, a precision motion stage controlling the displacement of the sample along the direction parallel to the direction of the probe beam, a motion stage driver, a focusing/collimating device, and a computer. The computer transfers control commends to the scanner driver for scanning the XY scanner, receives I- and Q-signal provided from the I/Q-interferometer, processes the I- and Q-signal to obtain the corresponding phase and amplitude values at each scanning point, calculates error signal for maintaining constant phase during the scanning, and transfers commends to the motion stage driver for the precision motion stage to compensate for phase changes caused by surface morphology during the scanning.
    Type: Application
    Filed: July 2, 2010
    Publication date: November 18, 2010
    Applicant: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SOGANG UNIVERSITY
    Inventors: Kyu-Man CHO, Kang-Hyuk KWON
  • Publication number: 20100128279
    Abstract: The present invention relates to a scanning microscope using a heterodyne interferometer, which can be used for mapping or imaging complex optical parameters such as physical structures and material properties of a sample under test. The heterodyne interferometer is designed to provide in- and quadrature-phase interference signal which can be used for extracting the phase and amplitude change induced on the probe beam. The phase and the amplitude of the probe beam, which is reflected from or transmitted through the sample, are modified by the physical structures and material properties of the sample. Therefore, by scanning the probe beam, local variations of the phase and amplitude can be mapped, and, thereby, three-dimensional microscopic physical structures and material properties can be imaged by processing the phase and amplitude values.
    Type: Application
    Filed: January 29, 2010
    Publication date: May 27, 2010
    Applicant: Industry-University Cooperation Foundation Sogang University
    Inventors: Kyuman CHO, Kang-Hyuk KWON
  • Publication number: 20070292141
    Abstract: An optical wireless communications network connects a plurality of communication cells, which are defined by dividing a local communication area, for enabling optical wireless communication in each of the communication cells. An optical signal transmitter is installed in each communication cell for irradiating the cell with a data-modulated optical signal to perform data transmission to a terminal located therein. The optical signal transmitter comprises an optical signal source for outputting the data-modulated optical signal, and an optical signal diffuser with a concave inside surface facing the output end of the optical signal source for diffusing and reflecting the data-modulated optical signal to irradiate the cell.
    Type: Application
    Filed: May 21, 2007
    Publication date: December 20, 2007
    Inventors: Byung-Jik Kim, Seong-Taek Hwang, Kyu-Man Cho, Hyeong-Jun Huh, Kang-Hyuk Kwon