Patents by Inventor Kang Yeon Kim

Kang Yeon Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11936022
    Abstract: A battery module includes at least one cell group, and a heat dissipating member coupled to one side of the at least one cell group to externally dissipate heat generated in the at least one cell group, wherein the at least one cell group includes at least one battery cell stack, a flame retardant cover coupled to the battery cell stack to encase both side surfaces and an upper portion of the battery cell stack, and a flame retardant member disposed between an upper surface of the battery cell stack and the flame retardant cover and formed of a porous material.
    Type: Grant
    Filed: August 12, 2021
    Date of Patent: March 19, 2024
    Assignee: SK ON CO., LTD.
    Inventors: Hae Ryong Jeon, Ho Yeon Kim, Kang Gu Lee, Seo Roh Rhee
  • Patent number: 7990536
    Abstract: There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.
    Type: Grant
    Filed: August 5, 2009
    Date of Patent: August 2, 2011
    Assignee: Gwangju Institute of Science and Technology
    Inventors: Kwan Heng Lee, Duck Bong Kim, Kang Su Park, Kang Yeon Kim, Myoung Kook Seo
  • Publication number: 20100033721
    Abstract: There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.
    Type: Application
    Filed: August 5, 2009
    Publication date: February 11, 2010
    Applicant: Gwangji Institute of Science and Technology
    Inventors: Kwan Heng LEE, Duck Bong KIM, Kang Su PARK, Kang Yeon KIM, Myoung Kook SEO