Patents by Inventor Kangpeng Shao

Kangpeng Shao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for testing a plurality of transistors in a target chip
    Patent number: 9146270
    Abstract: The present invention relates to the chip testing field. A method for testing a plurality of transistors in a target chip is provided, characterized by automatically selecting a plurality of pre-defined transistors on the target chip and adding a connection layer to the key layers of each transistor such that the transistor to be tested is connected with and measured by an outside tester. Through automatic generation of the test structures and automatic wiring, the present invention greatly shortens the design cycle of test chips for target transistor testing, and greatly reduces the error probability in the process of designing test chips for target transistor testing, and improves the testing relevancy.
    Type: Grant
    Filed: February 11, 2014
    Date of Patent: September 29, 2015
    Assignee: SEMITRONIX CORPORATION
    Inventors: Kangpeng Shao, Yongjun Zheng, Xu Ouyang
  • Method for Testing a Plurality of Transistors in a Target Chip
    Publication number: 20150002184
    Abstract: The present invention relates to the chip testing field. A method for testing a plurality of transistors in a target chip is provided, characterized by automatically selecting a plurality of pre-defined transistors on the target chip and adding a connection layer to the key layers of each transistor such that the transistor to be tested is connected with and measured by an outside tester. Through automatic generation of the test structures and automatic wiring, the present invention greatly shortens the design cycle of test chips for target transistor testing, and greatly reduces the error probability in the process of designing test chips for target transistor testing, and improves the testing relevancy.
    Type: Application
    Filed: February 11, 2014
    Publication date: January 1, 2015
    Applicant: Semitronix Corporation
    Inventors: Kangpeng Shao, Yongjun Zheng, Xu Ouyang