Patents by Inventor Kanji Nagasawa
Kanji Nagasawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 10088402Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.Type: GrantFiled: December 4, 2014Date of Patent: October 2, 2018Assignee: Hitachi High-Tech Science CorporationInventors: Shinya Nishimura, Kentaro Yamada, Kanji Nagasawa, Ryoji Takasawa
-
Publication number: 20150153292Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.Type: ApplicationFiled: December 4, 2014Publication date: June 4, 2015Inventors: Shinya Nishimura, Kentaro Yamada, Kanji Nagasawa, Ryoji Takasawa
-
Patent number: 9033574Abstract: A thermal analyzer (100) includes: a furnace tube (9) made of a transparent material; a heating furnace (3); a sample holding part (41, 42) arranged inside the furnace tube; a first support base (12); a second support base (14); a measurement chamber (30) connected to the furnace tube; a first movement part (22) for moving the first support base and the second support base between a measurement position, at which the furnace tube is connected to the measurement chamber, and a sample setting position, at which the sample holding part is exposed on a rear end side with respect to the furnace tube and the heating furnace; and a second movement part (24) for moving only the second support base to a sample observation position, at which the heating furnace is advanced and the furnace tube is exposed. Accordingly, the sample is observable from outside the exposed furnace tube.Type: GrantFiled: February 26, 2013Date of Patent: May 19, 2015Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Kanji Nagasawa, Kentaro Yamada, Shinya Nishimura
-
Patent number: 8068583Abstract: Provided is an X-ray analysis apparatus including: an X-ray tubular bulb for irradiating a sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; an analyzer for analyzing the signal; a sample stage capable of moving an irradiation point relatively with respect to the sample within a mapping area set in advance; and an X-ray mapping processing section for discriminating an X-ray intensity corresponding to a specific element, determining an intensity contrast in which a color or lightness is changed in accordance with the X-ray intensity, and for performing image display at a position corresponding to the irradiation point, in which the X-ray mapping processing section determines the intensity contrast of the X-ray intensity at the irradiation point by setting in advance the X-ray intensity discriminated as to a reference material in which a component elType: GrantFiled: June 30, 2009Date of Patent: November 29, 2011Assignee: SII Nanotechnology Inc.Inventors: Yoshiki Matoba, Kanji Nagasawa
-
Patent number: 7744273Abstract: A thermal analysis apparatus possesses a temperature sensor measuring a temperature of a heating furnace inside, a temperature program setter which can set a temperature program and outputs a temperature program signal, a temperature control section adjusting a supply electric power to a heater in compliance with a difference between the temperature program signal and a detection signal of the temperature sensor, a processor section calculating an air flow rate corresponding to a program temperature, and a mass flow controller which adjusts an air flow rate supplied to the heating furnace inside in compliance with a signal of the air flow rate calculated by the processor section. In the processor section, operation expressions calculating the air flow rate are set so as to differ respectively in a higher temperature side and a lower temperature side than a predetermined boundary temperature.Type: GrantFiled: August 20, 2007Date of Patent: June 29, 2010Assignee: SII Nanotechnology Inc.Inventors: Kanji Nagasawa, Rintaro Nakatani
-
Publication number: 20100002833Abstract: Provided is an X-ray analysis apparatus including: an X-ray tubular bulb for irradiating a sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; an analyzer for analyzing the signal; a sample stage capable of moving an irradiation point relatively with respect to the sample within a mapping area set in advance; and an X-ray mapping processing section for discriminating an X-ray intensity corresponding to a specific element, determining an intensity contrast in which a color or lightness is changed in accordance with the X-ray intensity, and for performing image display at a position corresponding to the irradiation point, in which the X-ray mapping processing section determines the intensity contrast of the X-ray intensity at the irradiation point by setting in advance the X-ray intensity discriminated as to a reference material in which a component elType: ApplicationFiled: June 30, 2009Publication date: January 7, 2010Inventors: Yoshiki Matoba, Kanji Nagasawa
-
Publication number: 20080279249Abstract: A thermal analysis apparatus possesses a temperature sensor measuring a temperature of a heating furnace inside, a temperature program setter which can set a temperature program and outputs a temperature program signal, a temperature control section adjusting a supply electric power to a heater in compliance with a difference between the temperature program signal and a detection signal of the temperature sensor, a processor section calculating an air flow rate corresponding to a program temperature, and a mass flow controller which adjusts an air flow rate supplied to the heating furnace inside in compliance with a signal of the air flow rate calculated by the processor section. In the processor section, operation expressions calculating the air flow rate are set so as to differ respectively in a higher temperature side and a lower temperature side than a predetermined boundary temperature.Type: ApplicationFiled: August 20, 2007Publication date: November 13, 2008Inventors: Kanji NAGASAWA, Rintaro NAKATANI
-
Patent number: 6390674Abstract: Under a same heating condition as a sample to be measured, a physical property is measured for a reference substance whose temperature dependency of a physical property value is previously known. Reversely, a temperature profile of the reference substance is read so that the temperature profile is applied to a physical property measurement result for the sample. Thus, thermal analysis for the large diameter sample is made accurately without the necessity of arranging a temperature sensor in the vicinity of the sample.Type: GrantFiled: January 13, 2000Date of Patent: May 21, 2002Assignee: Seiko Instruments Inc.Inventors: Nobutaka Nakamura, Kanji Nagasawa
-
Patent number: 4083729Abstract: An improved hydraulic cement composition having an almost constant air content, which is incorporated with an organic phosphoric acid ester of the formula ##STR1## Wherein R.sub.1 is a group of the formula: R.sub.4 --O--(CH.sub.2 CH.sub.2 O).sub.n -- wherein R.sub.4 is an alkyl having 4 to 18 carbon atoms, an alkenyl having 4 to 18 carbon atoms or an aryl substituted with an alkyl having 4 to 18 carbon atoms and n means an average addition molar number of ethylene oxide and is an integer of 0 to 15 in average, and R.sub.2 and R.sub.3 are the same or different and are each hydroxy or a group of the formula: R.sub.4 --O--(CH.sub.2 CH.sub.2 O).sub.n -- wherein R.sub.4 and n are as defined above, or a salt thereof with an inorganic or organic base, as an air entraining agent, optionally together with a dispersing agent and an accelerator.Type: GrantFiled: February 2, 1977Date of Patent: April 11, 1978Assignees: Fujisawa Pharmaceutical Co., Ltd., Dai-Ichi Kogyo Seiyaku Co., Ltd.Inventors: Senri Yamada, Kanji Nagasawa, Tokiaki Mori, Masaru Tanaka