Patents by Inventor Kanwar Inder SINGH

Kanwar Inder SINGH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Self-learning analytical attribute and clustering segmentation system
    Patent number: 11062236
    Abstract: A self-learning system for analytical attribute and clustering segmentation may be provided. A text classifier may identify a log description of a log entry in response to text of the log description being associated with indicators of a word model. A datafield classifier may generate a datafield metrics including an accuracy value of the attribute identifiers representing the datafield. A metafield classifier may generate a context metrics for the context of the log entry, the context metrics including an accuracy value of the attribute identifiers representing the metafields. A combination classifier may form a weighted classification set and select an attribute identifier as being representative of the datafield based on the weighted classification set. The combination classifier may further evaluate an attribute importance value of each attribute identifier, and select an attribute identifier having a top attribute importance value.
    Type: Grant
    Filed: August 26, 2020
    Date of Patent: July 13, 2021
    Assignee: ACCENTURE GLOBAL SOLUTIONS LIMITED
    Inventors: Kanwar Inder Singh, Shinichiro Shuda, Christopher Donnelly, Praveen Kishorepuria, Aaron L. Shifrin, Todd Bremer, Vivek Nadiminti, Barton FitzGerald Keery, Harshavardhan Basantkumar Kar
  • SELF-LEARNING ANALYTICAL ATTRIBUTE AND CLUSTERING SEGMENTATION SYSTEM
    Publication number: 20200394564
    Abstract: A self-learning system for analytical attribute and clustering segmentation may be provided. A text classifier may identify a log description of a log entry in response to text of the log description being associated with indicators of a word model. A datafield classifier may generate a datafield metrics including an accuracy value of the attribute identifiers representing the datafield. A metafield classifier may generate a context metrics for the context of the log entry, the context metrics including an accuracy value of the attribute identifiers representing the metafields. A combination classifier may form a weighted classification set and select an attribute identifier as being representative of the datafield based on the weighted classification set. The combination classifier may further evaluate an attribute importance value of each attribute identifier, and select an attribute identifier having a top attribute importance value.
    Type: Application
    Filed: August 26, 2020
    Publication date: December 17, 2020
    Applicant: Accenture Global Solutions Limited
    Inventors: Kanwar Inder SINGH, Shinichiro SHUDA, Christopher DONNELLY, Praveen KISHOREPURIA, Aaron L. SHIFRIN, Todd BREMER, Vivek NADIMINTI, Barton FitzGerald KEERY, Harshavardhan Basantkumar KAR