Abstract: A semiconductor integrated circuit according to the present invention comprises a circuit as a controlled object including an MOS transistor, wherein a control potential (at least one of a substrate potential and source potential) is to be controlled, a control signal generation circuit for generating a control signal with respect to the control potential based on an internal signal of the circuit as the controlled object, and a control potential control circuit for controlling the control potential (substrate potential/source potential) of the MOS transistor based on the control signal.

Abstract: A semiconductor integrated circuit according to the present invention comprises a circuit as a controlled object including an MOS transistor, wherein a control potential (at least one of a substrate potential and source potential) is to be controlled, a control signal generation circuit for generating a control signal with respect to the control potential based on an internal signal of the circuit as the controlled object, and a control potential control circuit for controlling the control potential (substrate potential/source potential) of the MOS transistor based on the control signal.

Abstract: A semiconductor integrated circuit according to the present invention comprises a circuit as a controlled object including an MOS transistor, wherein a control potential (at least one of a substrate potential and source potential) is to be controlled, a control signal generation circuit for generating a control signal with respect to the control potential based on an internal signal of the circuit as the controlled object, and a control potential control circuit for controlling the control potential (substrate potential/source potential) of the MOS transistor based on the control signal.

Abstract: A circuit analyzing device according to the present invention comprises a capacitance value extracting unit for extracting a capacitance value of a functional element from design information including layout information of a semiconductor integrated circuit and a capacitance value outputting unit for displaying the functional element in the semiconductor integrated circuit or a functional-element connecting wiring linked to the functional element on a design drawing including the layout information of the semiconductor integrated circuit in a discriminating manner in accordance with the capacitance value of the functional element, or comprises a per-attribute capacitance value operation unit for executing an operation of the capacitance value per attribute based on a functional-element attribute library in which attribute information of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the functional element and a per-attribute capacitance value outputting u

Abstract: A semiconductor integrated circuit according to the present invention comprises a circuit as a controlled object including an MOS transistor, wherein a control potential (at least one of a substrate potential and source potential) is to be controlled, a control signal generation circuit for generating a control signal with respect to the control potential based on an internal signal of the circuit as the controlled object, and a control potential control circuit for controlling the control potential (substrate potential/source potential) of the MOS transistor based on the control signal.