Abstract: A dielectric ceramic composition, comprising a main component including barium titanate, a fourth subcomponent including an oxide of R1 (note that R1 is at least one kind selected from a first element group composed of rare-earth elements having a effective ionic radius of less than 108 pm when having a coordination number of nine), and a fifth subcomponent including an oxide of R2 (note that R2 is at least one kind selected from a second element group composed of rare-earth elements having a effective ionic radius of 108 pm to 113 pm when having a coordination number of nine). According to the composition, a dielectric ceramic composition having excellent reducing resisting property at firing, excellent temperature dependence of capacitance after firing, and improved accelerated lifetime of insulation resistance can be provided.

Abstract: A dielectric ceramic composition, comprising a main component including barium titanate, a fourth subcomponent including an oxide of R1 (note that R1 is at least one kind selected from a first element group composed of rare-earth elements having a effective ionic radius of less than 108 pm when having a coordination number of nine), and a fifth subcomponent including an oxide of R2 (note that R2 is at least one kind selected from a second element group composed of rare-earth elements having a effective ionic radius of 108 pm to 113 pm when having a coordination number of nine). According to the composition, a dielectric ceramic composition having excellent reducing resisting property at firing, excellent temperature dependence of capacitance after firing, and improved accelerated lifetime of insulation resistance can be provided.

Abstract: A method of production of a multilayer ceramic chip capacitor having a capacitor body configured by alternately stacked dielectric layers and internal electrode layers, having using as a powder ingredient of barium titanate for forming the dielectric layers a powder ingredient having a ratio (I(200)/Ib) of a peak intensity (I(200)) of a diffraction line of a (200) plane with respect to an intensity (Ib) at an intermediate point between an angle of a peak point of diffraction line of a (002) plane and an angle of a peak point of diffraction line of a (200) plane in an X-ray diffraction chart of 4 to 16.

Abstract: A dielectric composition containing at least calcium titanate, strontium titanate, and barium titanate, wherein at least the molar ratios of composition of the three are such that the molar ratio of composition (P) of calcium titanate is 0.5 to 0.85, the molar ratio of composition (Q) of strontium titanate is 0.05 to 0.4, and the molar ratio of composition (R) of barium titanate is 0.1 to 0.2 (where, P+Q+R=1).

Abstract: A dielectric composition containing at least calcium titanate, strontium titanate, and barium titanate, wherein at least the molar ratios of composition of the three are such that the molar ratio of composition (P) of calcium titanate is 0.5 to 0.85, the molar ratio of composition (Q) of strontium titanate is 0.05 to 0.4, and the molar ratio of composition (R) of barium titanate is 0.1 to 0.2 (where, P+Q+R=1).

Abstract: A dielectric composition containing at least calcium titanate, strontium titanate, and barium titanate, wherein at least the molar ratios of composition of the three are such that the molar ratio of composition (P) of calcium titanate is 0.5 to 0.85, the molar ratio of composition (Q) of strontium titanate is 0.05 to 0.4, and the molar ratio of composition (R) of barium titanate is 0.1 to 0.2 (where, P+Q+R=1).

Abstract: A method of production of a multilayer ceramic chip capacitor having a capacitor body configured by alternately stacked dielectric layers and internal electrode layers, comprising using as a powder ingredient of barium titanate for forming the dielectric layers a powder ingredient having a ratio (I(200)/Ib) of a peak intensity (I(200)) of a diffraction line of a (200) plane with respect to an intensity (Ib) at an intermediate point between an angle of a peak point of diffraction line of a (002) plane and an angle of a peak point of diffraction line of a (200) plane in an X-ray diffraction chart of 4 to 16.