Abstract: Herein disclosed is a test device for testing an integrated circuit (IC) chip having a plurality of side edge portions each provided with a set of contact members. The test device comprises a socket base on which the IC chip is to be set, a plurality of contact units each including a contact support member and a set of socket contact members supported by the contact support member, and a contact retainer detachably mounted on the socket base to have the contact units retained with the socket contact members being held in contact with the contact members of the IC chip while the IC chip is set on the socket base. Each of the contact units can be removed from the socket base and replaced by a new contact unit if the socket contact members partly become fatigued and damaged, thereby making it possible to facilitate the maintenance of the test device.