Abstract: A process for treating a petroleum fraction and for efficiently absorbing an organic halogen compound from a fluid mixture of the organic halogen compound and an inorganic halogen compound derived from crude oil. Also disclosed is an improvement in absorption performance of a halogen-compound-absorbing material, thereby reducing the frequency with which the absorbing material is exchanged. The absorbing agent includes attapulgite (palygorskite) having high absorption performance with respect to organic halogen compounds. Also disclosed is an absorption column in which the aforementioned absorbing agent and a halogen-compound-absorbing agent, that includes zinc oxide, are disposed in series, thereby making it possible to raise the treatment performance with respect to a fluid that contains, in high concentrations, the organic halogen compound in addition to the inorganic halogen compound.

Abstract: To enable measurement of a displacement at a predetermined position in the case in which a measurement object remains stationary and also in the case in which the measurement object moves. A light projector and a scanning part are controlled to cause measurement light to sequentially irradiate different positions of the measurement object in a case in which a scanning mode is selected. On the other hand, the light projector and the scanning part are controlled to cause the measurement light to irradiate the same positions of the measurement object in a case in which a line mode is selected. The displacement of the measurement object is measured on the basis of a received-light quantity distribution output from a light receiver.

Abstract: To enable short-time measurement of a displacement at a predetermined position of a measurement object even when the position or the posture of the measurement object is changed. During operation of a displacement measuring apparatus, the position and the posture of a measurement object are determined by using position correction information, and a measurement position is corrected. The corrected measurement position is irradiated with measurement light. The measurement light that is emitted to and is reflected back from the measurement position is received by a light receiver. The light receiver outputs a received-light quantity distribution for displacement measurement, and a displacement at the measurement position is measured on the basis of the received-light quantity distribution.

Abstract: To enable measurement of a displacement at a predetermined position in the case in which a measurement object remains stationary and also in the case in which the measurement object moves. Alight projector and a scanning part are controlled to cause measurement light to sequentially irradiate different positions of the measurement object in a case in which a scanning mode is selected. On the other hand, the light projector and the scanning part are controlled to cause the measurement light to irradiate the same positions of the measurement object in a case in which a line mode is selected. The displacement of the measurement object is measured on the basis of a received-light quantity distribution output from a light receiver.

Abstract: To enable short-time measurement of a displacement at a predetermined position of a measurement object even when the position or the posture of the measurement object is changed. During operation of a displacement measuring apparatus, the position and the posture of a measurement object are determined by using position correction information, and a measurement position is corrected. The corrected measurement position is irradiated with measurement light. The measurement light that is emitted to and is reflected back from the measurement position is received by a light receiver. The light receiver outputs a received-light quantity distribution for displacement measurement, and a displacement at the measurement position is measured on the basis of the received-light quantity distribution.

Abstract: In one aspect of the invention, an image processing sensor system may include a plurality of image processing sensors each including an imaging device having an imaging unit imaging an inspection target and a lighting unit projecting light onto the inspection target, and an image processing device performing image processing on image data acquired in the imaging device and determining whether the inspection target is defective or non-defective, wherein the image processing sensors being are connected to each other so that data communication of data including the image data can be performed therebetween, and wherein a first image processing sensor transmits a signal relating to the completion of projecting light projecting light to a second image processing sensor, and the second image processing sensor starts projecting light and imaging and projection after receiving the signal relating the completion of projecting light.

Abstract: In one aspect of the invention, an image processing sensor system may include a plurality of image processing sensors each including an imaging device having an imaging unit imaging an inspection target and a lighting unit projecting light onto the inspection target, and an image processing device performing image processing on image data acquired in the imaging device and determining whether the inspection target is defective or non-defective, wherein the image processing sensors being are connected to each other so that data communication of data including the image data can be performed therebetween, and wherein a first image processing sensor transmits a signal relating to the completion of projecting light projecting light to a second image processing sensor, and the second image processing sensor starts projecting light and imaging and projection after receiving the signal relating the completion of projecting light.

Abstract: Provided is a method and apparatus for inspecting a defect of a shape formed on a substrate. Primary inspection is sequentially performed on specific patterns in a plurality of divided regions of the substrate by using an optical method, and one or more regions on which secondary inspection is to be performed are selected from the regions. One or more defects are detected by performing the secondary inspection using an electron beam on the selected regions.

Abstract: Provided is a method and apparatus for inspecting a defect of a shape formed on a substrate. Primary inspection is sequentially performed on specific patterns in a plurality of divided regions of the substrate by using an optical method, and one or more regions on which secondary inspection is to be performed are selected from the regions. One or more defects are detected by performing the secondary inspection using an electron beam on the selected regions.

Abstract: The invention has an object to provide a solid chloride absorbent which can efficiently absorb inorganic chlorides such as hydrogen chloride flowing out from a process in which a heavy naphtha and the like are treated and inorganic chloride derived from crude oil, and which is difficult to powder and soften after absorbing the chlorides. The solid chloride absorbent according to the invention comprises zinc oxide, a porous refractory inorganic matter and an inert binder, has a long life, and hardly releases the absorbed chlorides.

Abstract: The invention has an object to provide a solid chloride absorbent which can efficiently absorb inorganic chlorides such as hydrogen chloride flowing out from a process in which a heavy naphtha and the like are treated and inorganic chloride derived from crude oil, and which is difficult to powder and soften after absorbing the chlorides. The solid chloride absorbent according to the invention comprises zinc oxide, a porous refractory inorganic matter and an inert binder, has a long life, and hardly releases the absorbed chlorides.

Abstract: The invention has an object to provide a solid chloride absorbent which can efficiently absorb inorganic chlorides such as hydrogen chloride flowing out from a process in which a heavy naphtha and the like are treated and inorganic chloride derived from crude oil, and which is difficult to powder and soften after absorbing the chlorides. The solid chloride absorbent according to the invention comprises zinc oxide, a porous refractory inorganic matter and an inert binder, has a long life, and hardly releases the absorbed chlorides.