Abstract: A compact via transmission line for a printed circuit board having preferred characteristic impedance and capable of miniaturizing the printed circuit board including a multilayer printed circuit board, and extending the frequency range of a via transmission line mounted on the printed circuit board, and a design method of the same. The transmission line has a central conductor forming an inner conductor layer boundary make up a signal via hole, a plurality of via holes arranged around the central conductor form an outer conductor layer boundary, and a plurality of conductor plates formed of a printed circuit board conductor layer, is further provided with a constitutive parameter adjustment clearance hole between the inner and outer conductor layer boundaries of the compact via transmission line, and electrically isolates to prevent cross-talk of a signal propagating through a signal via hole with other signals in a high-frequency signal band.

Abstract: A plurality of through-hole vias connected to conductor layers is disposed with gaps left between these vias around opening parts disposed in the conductor layers in a printed board in which these conductor layers are disposed parallel to each other so as to sandwich a dielectric layer in between. Furthermore, through-hole vias used for excitation are disposed in the opening parts of the conductor layers and regions of the dielectric layer matching these opening parts in a non-contact manner with the conductor layers. When the complex dielectric constant is measured, a high-frequency power is applied to the through-hole vias, and the power loss between the through-hole vias and the conductor layers is measured by the S parameter method.

Abstract: According to one embodiment, a broadband transition to joint a via structure and a planar transmission line in a multilayer substrate is formed as an intermediate connection between the signal via pad and the planar transmission line disposed at the same conductor layer. The transverse dimensions of the transition are equal to the via pad diameter at the one end and strip width at another end; The length of the transition can be equal to the characteristic dimensions of the clearance hole in the direction of the planar transmission line or defined as providing the minimal excess inductive reactance in time-domain according to numerical diagrams obtained by three-dimensional full-wave simulations.

Abstract: A compact via transmission line for a printed circuit board having preferred characteristic impedance and capable of miniaturizing the printed circuit board including a multilayer printed circuit board, and extending the frequency range of a via transmission line mounted on the printed circuit board, and a design method of the same. The transmission line has a central conductor forming an inner conductor layer boundary make up a signal via hole, a plurality of via holes arranged around the central conductor form an outer conductor layer boundary, and a plurality of conductor plates formed of a printed circuit board conductor layer, is further provided with a constitutive parameter adjustment clearance hole between the inner and outer conductor layer boundaries of the compact via transmission line, and electrically isolates to prevent cross-talk of a signal propagating through a signal via hole with other signals in a high-frequency signal band.

Abstract: A via transmission line for a multilayer printed circuit board (PCB) in which a wave guiding channel is formed by a signal via or a number of signal vias, an assembly of ground vias surrounding the signal via or corresponding number of coupled signal vias, a set of ground plates from conductor layers of the multilayer PCB, and a clearance hole.

Abstract: A data transmitter uses a transmission line including a ground conductor (305), a signal conductor (201), and an insulating material (3) which insulates them from each other. The insulating material includes a dielectric (320) exhibiting a nonlinear relationship between a generated electric field and dielectric polarization. The effective reactance per unit length of the transmission line changes depending on the signal voltage. Data is transmitted between integrated circuits (102) via the transmission line, achieving data transmission at a higher speed than a conventional one.

Abstract: A compact via transmission line for a printed circuit board having preferred characteristic impedance and capable of miniaturizing the printed circuit board including a multilayer printed circuit board, and extending the frequency range of a via transmission line mounted on the printed circuit board, and a design method of the same. The transmission line has a central conductor forming an inner conductor layer boundary make up a signal via hole, a plurality of via holes arranged around the central conductor form an outer conductor layer boundary, and a plurality of conductor plates formed of a printed circuit board conductor layer, is further provided with a constitutive parameter adjustment clearance hole between the inner and outer conductor layer boundaries of the compact via transmission line, and electrically isolates to prevent cross-talk of a signal propagating through a signal via hole with other signals in a high-frequency signal band.

Abstract: A protection circuit prevents a circuit component from static charge unavoidably applied to a signal terminal, and includes a vertical bipolar transistor having an n-type deep well serving as an emitter region, a p-type well formed on the n-type deep well and serving as a base region and an n-type impurity region formed in the p-type well and serving as a collector region so as to reduce a base resistance regardless of a shallow trench isolation.

Abstract: The distance between an anode and a cathode of a thyristor and the anode and the cathode of a diode formed in a semiconductor protective circuit are made a small as allowable by LSI manufacturing technology, thereby achieving fast starting speed and a low internal resistance when in the conducting condition, so as to limit the rise in voltage on an internal circuit, even when a high-speed pulse is applied.

Abstract: In a semiconductor circuit device, an internal circuit, a common wiring pattern, a plurality of external terminals including a ground terminal, and a plurality of protection elements is provided. Each of the plurality of protection elements is connected to one of the plurality of external terminals and the common wiring pattern. Each protection element includes a clamp circuit. The clamp circuit of each of the plurality of protection elements respectively connected to the plurality of external terminals other than the ground terminal has a clamp voltage higher than a power supply voltage supplied to the internal circuit. On the other hand, the clamp circuit of the protection element connected to the ground terminal as a ground terminal clamp circuit has a clamp voltage lower than those of the clamp circuits other than the ground terminal clamp circuit.

Abstract: A Semiconductor integrated circuit with a protection circuit against electrostatic discharge. A clamping element is connected with MIS transistor to prevent the breakdown under the charged device model. A parasitic bipolar transistor, a MOS transistor or MIS transistor whose gate is composed of an insulating film thicker than that of the transfer gate, can be used as the clamping element.

Abstract: A semiconductor device includes a metal terminal provided on a semiconductor substrate and a protection element. The protection element includes an insulated gate field-effect transistor. The transistor has a first diffusion layer of a reverse conductive-type formed on one conductive type region of the semiconductor substrate and connected to the metal terminal, as its source. The transistor also includes a second diffusion layer of a reverse conductive-type connected to an electrode wire having a constant electric potential, as its source, and has a gate electrode connected to the electrode wire. A lateral bipolar transistor includes a third diffusion layer of a reverse conductive-type formed with a constant spaced distance with respect to the second diffusion layer and connected to the metal terminal, as its collector, and also has the second diffusion layer as its emitter, and furthermore has the one conductive-type region as its base.

Abstract: A lead on chip (LOC) semiconductor device or a chip on lead (COL) semiconductor device with a protection circuit. Non-connection pins are made shorter than connection pins to reduce the inductance of the non-connection pins, or to obtain a different capability of the protection circuit for non-connection pins with respect to connection pins. The time constant of the protection circuit for the non-connection pins is made longer than that of the protection circuit for the connection pins. Further, the clamping capability for the connection pins is made greater than that for another connection pin adjacent to the connection pin.

Abstract: In a semiconductor device including a semiconductor substrate, first and second external terminals, a first impurity diffusion region connected to the first external terminal, and second and third impurity diffusion regions forming a MIS transistor, one of the second and third impurity diffusion regions facing the first impurity region is connected to the second external terminal. The distance between the first diffusion region and the MIS transistor is substantially smaller than a certain value compared to conventional devices.

Abstract: In a semiconductor circuit device, an internal circuit, a common wiring pattern, a plurality of external terminals including a ground terminal, and a plurality of protection elements is provided. Each of the plurality of protection elements is connected to one of the plurality of external terminals and the common wiring pattern. Each protection element includes a clamp circuit. The clamp circuit of each of the plurality of protection elements respectively connected to the plurality of external terminals other than the ground terminal has a clamp voltage higher than a power supply voltage supplied to the internal circuit. On the other hand, the clamp circuit of the protection element connected to the ground terminal as a ground terminal clamp circuit has a clamp voltage lower than those of the clamp circuits other than the ground terminal clamp circuit.

Abstract: Voltage clamping elements are respectively paired with first diodes, and the pairs of voltage clamping elements/first diodes are connected between a first common discharge line and power terminals selectively supplied with positive power voltage and ground voltage; however, the pairs of voltage clamping elements/first diodes can not prevent an internal circuit from excess voltage if a positive electrostatic pulse with respect to the positive power voltage is applied to the ground terminal; second diodes are connected between a second common discharge line and the terminals in such a manner as to discharge the positive electrostatic pulse through the associated forward-biased second diodes, and the internal circuit is perfectly prevented from the excess voltage.

Abstract: According to the present invention, a MOSFET for an input/output protective circuit in which a source diffusion layer, a drain diffusion layer and a gate electrode are formed on a semiconductor substrate comprises a high melting point metal silicide layer disposed on the drain diffusion layer through a first insulating film, a metal wire layer disposed on the high melting point metal silicide layer through a second insulating film, at least two first contact holes for electrically connecting the high melting point metal silicide layer and the metal wire layer, and a second contact hole for electrically connecting the high melting point metal silicide layer and the drain diffusion layer, wherein the second contact hole is disposed at a substantial center between the two first contact holes.

Abstract: To protect a system efficiently from static electricity and electrostatic discharge (ESD) and thereby prevent the system from becoming defective, a system formed on a first conductivity-type semiconductor substrate includes a pad for receiving a signal, a protection element connected to the pad, and a discharge line connected to the protection element. The protection element includes a single bipolar transistor portion and at least one diode portion located adjacent to the bipolar transistor portion.

Abstract: A semiconductor device includes a metal terminal provided on a semiconductor substrate and a protection element. The protection element includes an insulated gate field-effect transistor. The transistor has a first diffusion layer of a reverse conductive-type formed on one conductive type region of the semiconductor substrate and connected to the metal terminal, as its source. The transistor also includes a second diffusion layer of a reverse conductive-type connected to an electrode wire having a constant electric potential, as its source, and has a gate electrode connected to the electrode wire. A lateral bipolar transistor includes a third diffusion layer of a reverse conductive-type formed with a constant spaced distance with respect to the second diffusion layer and connected to the metal terminal, as its collector, and also has the second diffusion layer as its emitter, and furthermore has the one conductive-type region as its base.

Abstract: A protective system incorporated in a semiconductor integrated circuit device has a shared discharging line and a plurality of protective circuits each having a diode and a lateral bipolar transistor coupled between an associated pad and the shared discharging line. Surge voltage applied to the pad is discharged through the associated protective circuit to the shared discharging line so that a main circuit is not destroyed by the surge voltage.