Patents by Inventor Karandas Pejathaya

Karandas Pejathaya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9552379
    Abstract: Systems and methods for foreign key identification are described. The method includes computing a threshold value for each of a primary key-foreign key (PK-FK) pair of a super-set of PK-FK, and generating a sub-set of PK-FK pairs based on comparison of the threshold value and a predefined threshold value. The predefined threshold value is indicative of an acceptance criterion. Further, the method includes determining a conformance score for each of the PK-FK pair of the subset of PK-FK pairs. The conformance score is based on deviations between Cumulative Probability Distribution (CPD) values of PK and CPD of FK for each PK-FK pair. Further, the method includes comparing the conformance score of the each PK-FK pair of the sub-set of PK-FK pairs with a predetermined acceptability index. The predetermined acceptability index is indicative of an acceptance of at least one positive FK from the set of PK-FK pairs.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: January 24, 2017
    Assignee: Tata Consultancy Services Limited
    Inventors: Karandas Pejathaya, Gopinath Talluri, Anand Shankar Bhide
  • Publication number: 20140089255
    Abstract: Systems and methods for foreign key identification are described. In one embodiment, the method includes computing a threshold value for each of a primary key-foreign key (PK-FK) pair of a super-set of PK-FK, and generating a sub-set of PK-FK pair based on comparison of the threshold value and a predefined threshold value, where the predefined threshold value is indicative of an acceptance criterion. Further, the method includes determining a conformance score for each of the PK-FK pair of the subset of PK-FK pair, wherein the conformance score is based on deviations between Cumulative Probability Distribution (CPD) values of PK and CPD of FK for each PK-FK pair. Further comparing the conformance score of the each PK-FK pair of the sub-set of PK-FK pairs with a predetermined acceptability index, where the predetermined acceptability index is indicative of an acceptance of at least one positive FK from the set of PK-FK pairs.
    Type: Application
    Filed: March 15, 2013
    Publication date: March 27, 2014
    Applicant: Tata Consultancy Services Limited
    Inventors: Karandas Pejathaya, Gopinath Talluri, Anand Shankar Bhide