Patents by Inventor Karel Blazek

Karel Blazek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180284300
    Abstract: Problem to be solved: Currently, the known manner of shortening the scintillation response of scintillation material is to suppress the amplitude-minor slower components (2) of the scintillation response, whereas the possibilities of significant shortening of the amplitude-dominant component of the scintillation response in this manner are limited. Solution: The invention concerns the manner of shortening the scintillation response of scintillator luminescence centres which uses co-doping with Ce or Pr together with co-doping with ions from the lanthanoids, 3d transition metals, 4d transition metals or 5s2 or 6s2 ions group.
    Type: Application
    Filed: October 5, 2016
    Publication date: October 4, 2018
    Inventors: Jindrich HOUZVICKA, Karel BLAZEK, Petr HORODYSKÝ, Martin NIKL, Pavel BOHÁCEK
  • Publication number: 20180059268
    Abstract: The scintillation detector for the detection of ionising radiation, especially electron, X-ray or particle radiation, including a monocrystalline substrate (1), minimally one buffer layer (2), minimally one nitride semiconductor layer (3, 4, 5, 6) applied onto the substrate (1) with epitaxy which is described by the AlyInxGa1-x-yN general formula where 0?x?1, 0?y?1 and 0?x+y?1 is valid, where minimally two nitride semiconductor layers (3, 4) are arranged in a layered heterostructure, whose structure contains minimally one potential well for radiant recombinations of electrons and holes.
    Type: Application
    Filed: February 8, 2016
    Publication date: March 1, 2018
    Inventors: Alice HOSPODKOVÁ, Karel BLAZEK, Eduaró HULICIUS, Jan TOUS, Martin NIKL
  • Publication number: 20130187055
    Abstract: A scintillation detection unit for the detection of back-scattered electrons for electron and ion microscopes having a column with longitudinal axis, in which the scintillation detection unit consists of body and at least one system for processing the light signal comprising a photodetector or a photodetector preceded with additional optical members where the body is at least partly made of scintillation material and is at least partly situated in a column of an electron or ion microscope and is made up of at least one hollow part. The height of the body of scintillation detection unit measured in the direction of longitudinal axis is greater than one-and-a-half times the greatest width measured in the direction perpendicular to the longitudinal axis of the hollow part with the greatest width.
    Type: Application
    Filed: October 6, 2011
    Publication date: July 25, 2013
    Applicants: Crytur Spol S.R.O., TESCAN A.S.
    Inventors: Martin Zadrazil, Silvie Dokulilova, Karel Blazek, Petr Horodyský