Abstract: A grating trim retarder fabricated from a form-birefringent multi-layer dielectric stack including at least one anti-reflection coating and supported on a transparent substrate is provided. The form-birefringent dielectric stack includes an axially-inhomogeneous element in the form of a ?C-plate grating and a transversely-inhomogeneous element in the form of an A-plate grating. Each of the ?C-plate and the A-plate gratings are fabricated with dimensions to form a zeroth order sub-wavelength grating structure. Fabricating the grating trim retarder with anti-reflection coatings and/or a segment where the ?C-plate and A-plate grating overlap enables the in-plane and out-of-plane retardances to be tailored independently according to the desired application.

Abstract: An oblique angle deposition is used to provide an A-plate optical retarder having at least one dense, form-birefringent layer. According to one embodiment, the dense, form-birefringent layer(s) are deposited as part of an FBAR stack to provide an all-dielectric full-function A/?C-plate trim retarder for LCD birefringence compensation. Advantageously, the dense structure of the full-function A/?C-plate trim retarder offers high durability and/or stability, thus making it well suited for providing polarization compensation in high light flux polarization-based projection systems.

Abstract: Thin-film coatings, which for example have alternating layers of high and low refractive index materials, are shown to function as both positive and negative C-plates, in dependence upon the incident radiation. In particular, the shape of the retardance versus angle of incidence profile is found to be determined, at least in part, by the phase thickness of the thin film coating (i.e., the optical thickness in terms of the wavelength of the incident radiation, which may, for example, be expressed in degrees, radians, or as the number of quarter wavelengths). These thin film coatings are optionally integrated into anti-reflection coatings, thin film interference filters and/or other components to improve efficiency and/or functionality.

Abstract: Thin-film coatings, which for example have alternating layers of high and low refractive index materials, are shown to function as both positive and negative C-plates, in dependence upon the incident radiation. In particular, the shape of the retardance versus angle of incidence profile is found to be determined, at least in part, by the phase thickness of the thin film coating (i.e., the optical thickness in terms of the wavelength of the incident radiation, which may, for example, be expressed in degrees, radians, or as the number of quarter wavelengths). These thin film coatings are optionally integrated into anti-reflection coatings, thin film interference filters and/or other components to improve efficiency and/or functionality.