Patents by Inventor Karen E. Walrath

Karen E. Walrath has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8415947
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.
    Type: Grant
    Filed: July 16, 2012
    Date of Patent: April 9, 2013
    Assignee: Jentek Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Publication number: 20130014589
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.
    Type: Application
    Filed: July 16, 2012
    Publication date: January 17, 2013
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrel E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Patent number: 8222897
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the meanders are oriented 90° apart while in a quadridirectional implementation the meanders are orientated at ?45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.
    Type: Grant
    Filed: June 12, 2008
    Date of Patent: July 17, 2012
    Assignee: JENTEK Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Patent number: 7994781
    Abstract: Reference standards or articles having prescribed levels of damage are fabricated by monitoring an electrical property of the article material, mechanically loading the article, and removing the load when a change in electrical properties indicates a prescribed level of damage. The electrical property is measured with an electromagnetic sensor, such as a flexible eddy current sensor, attached to a material surface, which may be between layers of the article material. The damage may be in the form of a fatigue crack or a change in the mechanical stress underneath the sensor. The shape of the article material may be adjusted to concentrate the stress so that the damage initiates under the sensor. Examples adjustments to the article shape include the use of dogbone geometries with thin center sections, reinforcement ribs on the edges of the article, and radius cut-outs in the vicinity of the thin section.
    Type: Grant
    Filed: August 3, 2009
    Date of Patent: August 9, 2011
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh
  • Publication number: 20090315540
    Abstract: Reference standards or articles having prescribed levels of damage are fabricated by monitoring an electrical property of the article material, mechanically loading the article, and removing the load when a change in electrical properties indicates a prescribed level of damage. The electrical property is measured with an electromagnetic sensor, such as a flexible eddy current sensor, attached to a material surface, which may be between layers of the article material. The damage may be in the form of a fatigue crack or a change in the mechanical stress underneath the sensor. The shape of the article material may be adjusted to concentrate the stress so that the damage initiates under the sensor. Examples adjustments to the article shape include the use of dogbone geometries with thin center sections, reinforcement ribs on the edges of the article, and radius cut-outs in the vicinity of the thin section.
    Type: Application
    Filed: August 3, 2009
    Publication date: December 24, 2009
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh
  • Patent number: 7589526
    Abstract: One of the issues with planar eddy-current sensors is the placement of the current return for the primary winding. Often the ends of the primary winding are spatially distant from one another, which creates an extraneous and large inductive loop that can influence the measurements. A sensor geometry featuring a primary winding that reduces the effect of this inductive loop is presented. The primary winding may include a plurality of parallel extended winding segments. The segments further include adjacent individual drive coils. Current flows through individual drive coils in an alternating fashion. Current flows through adjacent drive coil portions in a common direction, thereby imposing a spatially periodic magnetic field with at least two periods.
    Type: Grant
    Filed: May 30, 2007
    Date of Patent: September 15, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh
  • Publication number: 20090001974
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the angle is 90° while in a quadridirectional implementation the relative angles are ?45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements.
    Type: Application
    Filed: June 12, 2008
    Publication date: January 1, 2009
    Applicant: JENTEK Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Patent number: 7451657
    Abstract: Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: November 18, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein, Andrew P. Washabaugh, Volker Weiss, Christopher A. Craven, Ian C. Shay, David C. Grundy, Karen E. Walrath, Robert J. Lyons
  • Patent number: 7348771
    Abstract: Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: March 25, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukemik
  • Patent number: 7230421
    Abstract: Reference standards or articles having prescribed levels of damage are fabricated by monitoring an electrical property of the article material, mechanically loading the article, and removing the load when a change in electrical properties indicates a prescribed level of damage. The electrical property is measured with an electromagnetic sensor, such as a flexible eddy current sensor, attached to a material surface, which may be between layers of the article material. The damage may be in the form of a fatigue crack or a change in the mechanical stress underneath the sensor. The shape of the article material may be adjusted to concentrate the stress so that the damage initiates under the sensor. Examples adjustments to the article shape include the use of dogbone geometries with thin center sections, reinforcement ribs on the edges of the article, and radius cut-outs in the vicinity of the thin section.
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: June 12, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Volker Weiss, Andrew P. Washabaugh, Vladimir A. Zilberstein
  • Patent number: 7161350
    Abstract: Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7049811
    Abstract: A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: May 23, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Publication number: 20040232911
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Application
    Filed: June 23, 2004
    Publication date: November 25, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6798198
    Abstract: Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: September 28, 2004
    Assignee: JENTEK Sensors, Inc.
    Inventors: Vladimir Tsukernik, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker, Karen E. Walrath, Eric Hill, Vladimir A. Zilberstein
  • Patent number: 6784662
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Grant
    Filed: March 19, 2002
    Date of Patent: August 31, 2004
    Assignee: Jentek Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Publication number: 20040066188
    Abstract: Inductive sensors measure the near surface properties of conducting magnetic materials. The sensors generally include parallel winding segments to induce a spatially periodic magnetic field in a material under test. The sensors may provide a directionally dependent measure with measurements made in varying orientations of the sensor with respect to the material property variation directions. The sensors may be thin, conformable sensors that can be mounted on a test material and, for example, monitor crack initiation under the sensor. A second sensor may be left in air to provide a reference measurement, or the temperature of the material under test can be varied to verify the response of the individual sensing elements. Sensors can be mounted to materials under test in order to not modify the environment that is causing the stress being monitored.
    Type: Application
    Filed: August 4, 2003
    Publication date: April 8, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Publication number: 20030155914
    Abstract: Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.
    Type: Application
    Filed: January 21, 2003
    Publication date: August 21, 2003
    Applicant: JENTEK Sensors, Inc.
    Inventors: Vladimir Tsukernik, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker, Karen E. Walrath, Eric Hill, Vladimir A. Zilberstein
  • Publication number: 20030071615
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Application
    Filed: March 19, 2002
    Publication date: April 17, 2003
    Applicant: JENTEK Sensors
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6420867
    Abstract: An apparatus and a method of detecting wide spread fatigue damage (WFD) on aircraft using the absolute conductivity of the metal. A meandering winding magnetometer (MWM) having a plurality of parallel spaced linear conductor elements are placed in proximity to the aircraft. An electromagnetic field is imposed on the aircraft and the resulting response is sensed. The response is transformed to determine the conductivity of the aircraft structure. The mapping of the conductivity of the aircraft structure produces an indication where microcracks are located in the structure. These early indications of the density, spatial distribution and spatial orientation, as well as the size, of the microcracks give the user an indication of WFD.
    Type: Grant
    Filed: March 13, 1998
    Date of Patent: July 16, 2002
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis
  • Patent number: 6377039
    Abstract: A system for characterizing coatings and substrates of a material under test. A sensor is positioned against a coated sample which is to be measured to obtain phase and magnitude measurements. Penetration depth of the magnetic waves of the sensor is a function of frequency. Measurements are made at each of a plurality of signal frequencies. The measured phase and magnitude data is applied with respect to a frequency independent parameter, such as conductivity, using a grid method. The conductivities of the coating and the substrate are determined by the limits of conductivity with respect to frequency. With the assumed conductivities of the coating and substrate, the sensor is once again placed over the material, and coating thickness and lift-off are determined. By examining the coating thickness versus frequency the accuracy of the measurement can be determined, since actual coating thickness does not vary with frequency in the material.
    Type: Grant
    Filed: November 13, 1998
    Date of Patent: April 23, 2002
    Assignee: Jentek Sensors, Incorporated
    Inventors: Neil J. Goldfine, Kevin G. Rhoads, Karen E. Walrath, David C. Clark