Abstract: A field of electric drive devices and arrangements including a plurality of power semiconductor components formed in or on a common substrate, and more particularly to a method and an apparatus for monitoring the condition of a power semiconductor module. The method for monitoring the condition of a power semiconductor module of an electric drive device connected to an electric machine includes the steps of engaging a locking of the rotor of the electric machine at zero speed or at near zero speed by injecting DC currents by the electric drive device, initiating test temperature recording in the power semiconductor module, disengaging the locking the rotor of the electric machine by the electric drive device, terminating the test temperature recording and storing the recorded data of the test temperature as test temperature data, and determining the condition of the power semiconductor module utilising the test temperature data.

Abstract: A rotating electrical machine and a method of manufacturing a rotating electrical machine. The machine including a machine frame, a rotor, a shaft attached to the rotor and bearings supporting the shaft and the rotor in the machine frame. The rotating electrical machine includes further an electrically conducting member having a hole, the electrically conducting member being attached to the frame such that the shaft extends through the hole.

Abstract: A rotating electrical machine and a method of manufacturing a rotating electrical machine. The machine including a machine frame, a rotor, a shaft attached to the rotor and bearings supporting the shaft and the rotor in the machine frame. The rotating electrical machine includes further an electrically conducting member having a hole, the electrically conducting member being attached to the frame such that the shaft extends through the hole.

Abstract: Estimating junction temperature in a power semiconductor includes monitoring electrical current direction so as to determine which of a first and a second power semiconductor is in an on-state, and sensing a voltage drop across the one of the power semiconductors. Voltage drop may be correlated with temperature according to a gain dependent upon a level of the electrical current.

Abstract: Monitoring aging in an electric drive system includes energizing the electric drive system such that electrical current flows through a power semiconductor device therein, determining a value indicative of a voltage across the power semiconductor device, at a current level where voltage is substantially independent of temperature, comparing the determined value with a reference value, and outputting a signal responsive to a difference between the values that is indicative of an aging state of the power semiconductor device.

Abstract: Unique systems, methods, techniques and apparatuses of a gate driver are disclosed herein. One exemplary embodiment is a gate driver comprising a first and second DC rail, a first converter arm including a first and second semiconductor device, a second converter arm including a third and fourth semiconductor device, an inductor, and a controller. The controller is configured to open and close the primary switching device by operating the semiconductor devices so as to transmit power between the gate driver and a gate of a primary switching device. The controller is configured to transmit a gate signal to the primary switching device by closing the second semiconductor device, then opening the second semiconductor device and closing the fourth semiconductor device in response to the gate of the primary switching device receiving power with a voltage greater than or equal in magnitude to the voltage of the second DC rail.

Abstract: Unique systems, methods, techniques and apparatuses of a gate driver are disclosed herein. One exemplary embodiment is a gate driver comprising a first and second DC rail, a first converter arm including a first and second semiconductor device, a second converter arm including a third and fourth semiconductor device, an inductor, and a controller. The controller is configured to open and close the primary switching device by operating the semiconductor devices so as to transmit power between the gate driver and a gate of a primary switching device. The controller is configured to transmit a gate signal to the primary switching device by closing the second semiconductor device, then opening the second semiconductor device and closing the fourth semiconductor device in response to the gate of the primary switching device receiving power with a voltage greater than or equal in magnitude to the voltage of the second DC rail.

Abstract: Monitoring aging in an electric drive system includes energizing the electric drive system such that electrical current flows through a power semiconductor device therein, determining a value indicative of a voltage across the power semiconductor device, at a current level where voltage is substantially independent of temperature, comparing the determined value with a reference value, and outputting a signal responsive to a difference between the values that is indicative of an aging state of the power semiconductor device.

Abstract: Estimating junction temperature in a power semiconductor includes monitoring electrical current direction so as to determine which of a first and a second power semiconductor is in an on-state, and sensing a voltage drop across the one of the power semiconductors. Voltage drop may be correlated with temperature according to a gain dependent upon a level of the electrical current.

Abstract: A method and an apparatus for an arrangement including a power semiconductor module with a cooling interface which is connected to a cooling element. The method first measures a first temperature value of the cooling interface, and then changes an operating mode of the power semiconductor module, wherein the operating mode is selected from an active mode and an inactive mode. The method then waits a determined time, measures a second temperature value of the cooling interface, and determines a temperature difference between the first temperature value and the second temperature value. The method then determines a level of a fault risk on the basis of the temperature difference. The apparatus implements the method.

Abstract: A method of reducing thermal stresses of a semiconductor component in a frequency converter, an arrangement in a frequency converter, and a frequency converter, wherein the semiconductor component is attached to a cooling element for cooling the semiconductor component and one or more resistive elements are attached to the cooling element. In the method, the cooling element is heated by the one or more resistive elements attached thereto by supplying current from the frequency converter through the one or more resistive elements for obtaining an elevated lowest temperature for the semiconductor component and thereby reducing the amount of temperature change between the highest and the lowest temperatures in the semiconductor component during use of the frequency converter.

Abstract: A method of reducing thermal stresses of a semiconductor component in a frequency converter, an arrangement in a frequency converter, and a frequency converter, wherein the semiconductor component is attached to a cooling element for cooling the semiconductor component and one or more resistive elements are attached to the cooling element. In the method, the cooling element is heated by the one or more resistive elements attached thereto by supplying current from the frequency converter through the one or more resistive elements for obtaining an elevated lowest temperature for the semiconductor component and thereby reducing the amount of temperature change between the highest and the lowest temperatures in the semiconductor component during use of the frequency converter.

Abstract: A man machine interface for an A-C motor bypass has a membrane keypad with a multiplicity of pushbuttons connected to a micro-controller. The micro-controller controls the flow of current to the coil of each of the drive and bypass contactors to thereby open or close those contactors depending on if the motor is to be driven and how it is to be driven. The micro-controller includes code that simulates a first state machine that determines the operating condition of the drive and bypass contactors and if it is desired to open that one of the two contactors which is presently open and close that one of the two contactors when is presently open. The micro-controller includes code which simulates a second state machine which is active only when the inverter contactor is open. This state machine determines if the motor is to run or stop and closes or opens the bypass contactor accordingly.