Abstract: This disclosure presents methods and systems to reduce measurement jitter of a resonating element. A time control is utilized to analyze the phase of a received frequency from the resonating element. Using that analysis, the time control can determine a next time point to direct the re-excitation of the resonating element. Through controlling when the resonating element is electrically excited, the measurement analyzer can determine a pressure or temperature at the location of the resonating element while accounting for remaining resonating energy from previous electrical excitations. The method and system can allow for measurements to be taken at a significantly faster rate while reducing uncertainty, e.g., jitter, in the collected measurements.

Abstract: This disclosure presents methods and systems to reduce measurement jitter of a resonating element. A time control is utilized to analyze the phase of a received frequency from the resonating element. Using that analysis, the time control can determine a next time point to direct the re-excitation of the resonating element. Through controlling when the resonating element is electrically excited, the measurement analyzer can determine a pressure or temperature at the location of the resonating element while accounting for remaining resonating energy from previous electrical excitations. The method and system can allow for measurements to be taken at a significantly faster rate while reducing uncertainty, e.g., jitter, in the collected measurements.