Patents by Inventor Karl H. Fischer

Karl H. Fischer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for examining a test object by means of gamma or X-rays
    Patent number: 5150395
    Abstract: A device for examining a test object (4) by means of gamma or X-rays, comprising a primary X-ray source for generating at least one primary X-ray pencil beam (3) which is directed onto the test object (4), and at least one slit diaphragm (8, 9) which is arranged between the test object (4) and a detector (6, 7) and which directs scattered X-rays (26, 27, 28, 29) produced by the primary X-ray beam (3) in the test object (4) onto at least one detector (6, 7). The depth range of the test object that can be covered by the detectors can be changed without changing the position of the test object or the examination device, in that the position of the slit diaphragm (8, 9) relative to the detector (6, 7) can be changed by means of an adjusting device (18, 19).
    Type: Grant
    Filed: January 4, 1991
    Date of Patent: September 22, 1992
    Assignee: U.S. Philips Corporation
    Inventors: Josef Kosanetzky, Karl H. Fischer