Patents by Inventor Karl-Heinz Irmer

Karl-Heinz Irmer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for user guidance in optical inspection and measurement of thin films and substrates, and software therefore
    Patent number: 6775583
    Abstract: A method, apparatus, and software for guiding users during optical inspection and measurement of coated and noncoated substrates with an optical measurement system is provided. The optical measurement system incorporates an integrated recipe and data browser with sortable features to facilitate the optical inspection and measurement by the user.
    Type: Grant
    Filed: July 9, 2001
    Date of Patent: August 10, 2004
    Assignee: Leica Microsystems Jena GmbH
    Inventors: Matthias Slodowski, Karl-Heinz Irmer
  • Method and apparatus for user guidance in optical inspection and measurement of thin films and substrates, and software therefore
    Publication number: 20020024663
    Abstract: A method, apparatus, and software for guiding users during optical inspection and measurement of coated and noncoated substrates with an optical measurement system is provided. The optical measurement system incorporates an integrated recipe and data browser with sortable features to facilitate the optical inspection and measurement by the user.
    Type: Application
    Filed: July 9, 2001
    Publication date: February 28, 2002
    Inventors: Matthias Slodowski, Karl-Heinz Irmer