Abstract: Device to adjust the position and/or size of a pinhole in a laser scanning microscope (LSM) where the pinhole is illuminated via a separate light source or the LSM laser and the pinhole is moved at a right angle to the optical axis until the receiver has the maximum intensity and the pinhole position is captured and saved together with the data attributed to the replaceable optical components.

Abstract: Device to adjust the position and/or size of a pinhole in a laser scanning microscope (LSM) where the pinhole is illuminated via a separate light source or the LSM laser and the pinhole is moved at a right angle to the optical axis until the receiver has the maximum intensity and the pinhole position is captured and saved together with the data attributed to the replaceable optical components.

Abstract: Adjustable pinhole, particularly for the illumination beam path and/or detection beam path of a laser scanning microscope, wherein the pinhole is defined by foil edges which are adjustable relative to one another, and at least two foils, each with at least one straight edge, are advantageously arranged relative to one another and/or connected to one another in such a way that their edges describe an L-shape and the L-shaped connection pieces are arranged on one another in such a way that they define a rhombic or square light passage and they are moved relative to one another for adjusting the pinhole.

Abstract: A rotary device (1) is provided for an optic tomograph, with the sample carrier (4) with the object (5) to be examined being rotational around a predetermined axis (6) of the object, with the rotary device (1) having a rotary module (8; 15), which can cause a rotation around a first rotary axis (10), a first positioning module (7) connected to the rotary module (8), by which the first rotary module (8; 15) can be positioned along the first rotary axis (10), and a second positioning module (9; 11; 12; 16; 17) connected to the rotary module (8; 15), at which the sample carrier (4) with the object (5) to be examined can be fastened, allowing the axis (6) of the object to be positioned in reference to the first rotary axis (10) by the second positioning module (9; 11, 12; 16; 17) such that a rotation of the rotary module (8; 15) rotates the object (5) around the axis (6) of the object.

Abstract: Adjustable pinhole, particularly for the illumination beam path and/or detection beam path of a laser scanning microscope, wherein the pinhole is defined by foil edges which are adjustable relative to one another, and at least two foils, each with at least one straight edge, are advantageously arranged relative to one another and/or connected to one another in such a way that their edges describe an L-shape and the L-shaped connection pieces are arranged on one another in such a way that they define a rhombic or square light passage and they are moved relative to one another for adjusting the pinhole.

Abstract: Adjustable pinhole, particularly for the illumination beam path and/or detection beam path of a laser scanning microscope, wherein the pinhole is defined by foil edges which are adjustable relative to one another, and at least two foils, each with at least one straight edge, are advantageously arranged relative to one another and/or connected to one another in such a way that their edges describe an L-shape and the L-shaped connection pieces are arranged on one another in such a way that they define a rhombic or square light passage and they are moved relative to one another for adjusting the pinhole.

Abstract: An adjustable pinhole for a laser scanning microscope. The adjustable pinhole includes first and second silicon apertures movable relative to each other, each of the silicon apertures having a rectangular mirror-inverted opening, the relative movement of the openings defining a pinhole of varying size. The relative movement can be in two directions, whereby the first and second silicon apertures are displaceable with respect to one another in a first direction and whereby at least one of the silicon apertures is displaceable in a second direction perpendicular to the first direction for adjustment to obtain an exact square form for the configuration of the pinhole.

Abstract: In an adjusting device for displacing individual elements (2) of optical systems or of measuring systems in which the element to be displaced is movable on a base (1) along a predetermined direction (x) by means of a piezoelectric actuator arrangement (21, 22) which is supported by the element (2) and which is constructed and controllable in such a way that it exerts shock pulses on the element (2) in order to carry out a stepwise movement of the element (2) on the base (1), the element (2) is arranged in a body (1; 27) which has an open or closed hollow cross section and is supported in a frictional engagement on this body, at least at one location, with the intermediary of a pretensioned spring device (8, 8?).

Abstract: A telescope has an optical axis established by the optical elements of the telescope and at least one lens mounted displaceably along the optical axis. A motorized drive is provided for driving the at least one displaceably mounted lens.

Abstract: Adjustable pinhole, particularly for the illumination beam path and/or detection beam path of a laser scanning microscope, wherein the pinhole is defined by foil edges which are adjustable relative to one another, and at least two foils, each with at least one straight edge, are advantageously arranged relative to one another and/or connected to one another in such a way that their edges describe an L-shape and the L-shaped connection pieces are arranged on one another in such a way that they define a rhombic or square light passage and they are moved relative to one another for adjusting the pinhole.

Abstract: In an arrangement for detecting the position of two bodies moving relative to one another by a light barrier system, a device is arranged on at least one of the moving bodies such that when the bodies move relative to one another there is a change in the signal of the light barrier system that can be evaluated. At least one pair of light barrier systems is connected one with the other directly or via an electronic circuit.

Abstract: In an adjusting device for displacing individual elements (2) of optical systems or of measuring systems in which the element to be displaced is movable on a base (1) along a predetermined direction (x) by means of a piezoelectric actuator arrangement (21, 22) which is supported by the element (2) and which is constructed and controllable in such a way that it exerts shock pulses on the element (2) in order to carry out a stepwise movement of the element (2) on the base (1), the element (2) is arranged in a body (1; 27) which has an open or closed hollow cross section and is supported in a frictional engagement on this body, at least at one location, with the intermediary of a pretensioned spring device (8, 8′).

Abstract: In a probe element for coordinate measuring systems using micro-probe elements and piezo-resonators which change their resonance characteristics upon contact, the probe element has piezo-resonators arranged in a polygonal configuration. Micro-probe elements are arranged in a polygonal configuration on the piezo-resonators and sense inner and outer surfaces in different coordinates. The tactile sensing of the micro-probe elements on the surface of the specimen is effected by measuring the change in the resonance characteristics of the piezo-resonators.