Abstract: A phase noise measurement method of measuring phase noise of a device under test is described. The phase noise measurement method includes the steps of: determining, by a measurement circuit, measurement IQ data based on an output signal of a device under test; setting, by a control circuit, a magnitude threshold; determining, by an analysis circuit, critical samples of reference IQ data for which a magnitude of a reference signal is smaller than the magnitude threshold; discarding the critical samples of the reference IQ data and corresponding critical samples of the measurement IQ data, thereby obtaining modified reference IQ data and modified measurement IQ data; and determining, by the analysis circuit, a phase noise spectrum of the output signal of the device under test based on the modified reference IQ data and based on the modified measurement IQ data. Further, a measurement system is described.

Abstract: The present disclosure relates to a predistortion method and a predistortion system for a non-linear device-under-test, DUT. The predistortion method comprises the steps of: providing a reference input waveform to the DUT; deriving a predistorted waveform for the DUT based on the reference input waveform using an iterative direct digital predistortion technique; analyzing a relationship between the reference input waveform and the calculated predistorted waveform using a mathematical model; deriving a predistortion algorithm for the DUT based on said analysis; and applying said predistortion algorithm to an input signal and feeding the, thus, predistorted input signal to the DUT.