Patents by Inventor Karpinskyy Bohdan

Karpinskyy Bohdan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11303461
    Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: April 12, 2022
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan, Kalesnikau Aliaksei, Yun-Hyeok Choi
  • Publication number: 20200145235
    Abstract: Systems and methods are described based on an integrated circuit that performs a challenge-response physically unclonable function (PUF). The PUF is used for challenge-response authentication. The integrated circuit includes a PUP block configured to output an n-bit internal response corresponding to a challenge that requests a response where n is an integer greater than 1 and a response generator configured to calculate a Hamming weight of the internal response and output the response by comparing the Hamming weight with at least one reference.
    Type: Application
    Filed: September 11, 2019
    Publication date: May 7, 2020
    Inventors: Yunhyeok Choi, Yongki Lee, Yongsoo Kim, Jieun Park, Karpinskyy Bohdan
  • Publication number: 20200099542
    Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.
    Type: Application
    Filed: November 8, 2019
    Publication date: March 26, 2020
    Inventors: Ihor VASYLTSOV, Karpinskyy BOHDAN, Kalesnikau ALIAKSEI, Yun-hyeok CHOI
  • Patent number: 10498544
    Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.
    Type: Grant
    Filed: June 28, 2018
    Date of Patent: December 3, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan, Kalesnikau Aliaksei, Yun-hyeok Choi
  • Patent number: 10146507
    Abstract: An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.
    Type: Grant
    Filed: January 12, 2017
    Date of Patent: December 4, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Karpinskyy Bohdan, Yong-ki Lee, Mi-jung Noh, Sang-wook Park, Kitak Kim, Yong-Soo Kim, Yun-hyeok Choi
  • Publication number: 20180302229
    Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.
    Type: Application
    Filed: June 28, 2018
    Publication date: October 18, 2018
    Inventors: Ihor VASYLTSOV, Karpinskyy BOHDAN, Kalesnikau ALIAKSEI, Yun-hyeok CHOI
  • Patent number: 10044513
    Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.
    Type: Grant
    Filed: August 15, 2014
    Date of Patent: August 7, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan, Kalesnikau Aliaksei, Yun-hyeok Choi
  • Publication number: 20180136907
    Abstract: An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.
    Type: Application
    Filed: January 12, 2017
    Publication date: May 17, 2018
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Karpinskyy BOHDAN, Yong-ki LEE, Mi-jung NOH, Sang-wook PARK, Ki-tak KIM, Yong-Soo KIM, Yun-hyeok CHOI
  • Publication number: 20170048061
    Abstract: An apparatus for generating a random number includes a plurality of metastability entropy sources, a first meta-ring oscillator, and a second meta-ring oscillator. The first meta-ring oscillator includes a first portion of the plurality of metastability entropy sources. The second meta-ring oscillator includes a second portion of the plurality of metastability entropy sources. Each of the first meta-ring oscillator and the second meta-ring oscillator generates a first random number based on a metastability signal in a first mode and operate as a ring oscillator and generate a second random number in a second mode. A number of metastability entropy sources included in the first meta-ring oscillator are less than a number of metastability entropy sources included in the second meta-ring oscillator. The first meta-ring oscillator includes at least one metastability entropy source.
    Type: Application
    Filed: July 25, 2016
    Publication date: February 16, 2017
    Inventors: KARPINSKYY BOHDAN, YONG-KI LEE, YONG-SOO KIM, YUN-HYEOK CHOI
  • Publication number: 20150067895
    Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.
    Type: Application
    Filed: August 15, 2014
    Publication date: March 5, 2015
    Inventors: Ihor VASYLTSOV, Karpinskyy BOHDAN, Kalesnikau ALIAKSEI, Yun-hyeok CHOI
  • Patent number: 8886692
    Abstract: An apparatus for generating a random number has high entropy. The apparatus includes a plurality of random number generators, each of which generates a metastability signal and generates a random number by using the generated metastability signal in a first mode, and in a second mode, the plurality of random number generators are connected to one another to operate as a ring oscillator.
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: November 11, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan
  • Patent number: 8874632
    Abstract: An apparatus configured to generate random numbers is provided, the apparatus having high entropy and being capable of a reduced chip size. The apparatus includes a plurality of metastable state generation units configured to generate a metastable state signal, a plurality of amplification units configured to amplify the metastable state signal, a connection signal generation unit configured to generate a first connection signal, and a first commutation unit configured to connect at least one metastable state generation unit to at least one amplification unit according to the first connection signal. For example, the number of metastable state generation units and amplification units necessary to achieve are threshold number of commutation connections can be greatly reduced as compared to conventional apparatuses for generating random numbers.
    Type: Grant
    Filed: March 6, 2012
    Date of Patent: October 28, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan
  • Publication number: 20120233231
    Abstract: An apparatus configured to generate random numbers is provided, the apparatus having high entropy and being capable of a reduced chip size. The apparatus includes a plurality of metastable state generation units configured to generate a metastable state signal, a plurality of amplification units configured to amplify the metastable state signal, a connection signal generation unit configured to generate a first connection signal, and a first commutation unit configured to connect at least one metastable state generation unit to at least one amplification unit according to the first connection signal. For example, the number of metastable state generation units and amplification units necessary to achieve are threshold number of commutation connections can be greatly reduced as compared to conventional apparatuses for generating random numbers.
    Type: Application
    Filed: March 6, 2012
    Publication date: September 13, 2012
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan
  • Publication number: 20110302232
    Abstract: An apparatus for generating a random number has high entropy. The apparatus includes a plurality of random number generators, each of which generates a metastability signal and generates a random number by using the generated metastability signal in a first mode, and in a second mode, the plurality of random number generators are connected to one another to operate as a ring oscillator.
    Type: Application
    Filed: August 17, 2011
    Publication date: December 8, 2011
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Ihor Vasyltsov, Karpinskyy Bohdan