Patents by Inventor Karsten Zeiske

Karsten Zeiske has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9052247
    Abstract: A device and a method for evaluating signals from load cells with strain gauges (SG), which require electronic signal evaluation with very low offset voltages due to the small output signal. In order to be able to use inexpensive components as well, two different operating points of the SG are set in two consecutive measurements, each being determined by a single voltage reference. The voltage in the zero branch of the bridge circuit of the SG is amplified in a differential amplifier and digitized with an ADC. In this context, the reference for the ADC is derived from the operating point of the SG that is determined by the respective voltage reference. The digitized offset and the initial value of the load cell are calculated from the two measurement values in an arithmetic logic unit.
    Type: Grant
    Filed: February 9, 2012
    Date of Patent: June 9, 2015
    Assignee: Panasonic Industrial Devices Europe GmbH
    Inventor: Karsten Zeiske
  • Publication number: 20140182387
    Abstract: A device and a method for evaluating signals from load cells with strain gauges (SG), which require electronic signal evaluation with very low offset voltages due to the small output signal. In order to be able to use inexpensive components as well, two different operating points of the SG are set in two consecutive measurements, each being determined by a single voltage reference. The voltage in the zero branch of the bridge circuit of the SG is amplified in a differential amplifier and digitised with an ADC. In this context, the reference for the ADC is derived from the operating point of the SG that is determined by the respective voltage reference. The digitised offset and the initial value of the load cell are calculated from the two measurement values in an arithmetic logic unit.
    Type: Application
    Filed: February 9, 2012
    Publication date: July 3, 2014
    Applicant: PANASONIC INDUSTRIAL DEVICES EUROPE GMBH
    Inventor: Karsten Zeiske
  • Patent number: 7001071
    Abstract: In a method and a device for setting the focal spot position of an X-ray tube the focal spot position is regulated as a controlled variable by a closed loop regulation circuit. A deflector deflects the electron beam of the X-ray tube depending on a deflection signal, a deflection closed loop regulator generates the deflection signal depending on a focal spot position signal. A measurement arrangement measures a focal spot position signal. The deflector, the deflection closed loop regulator and the measurement arrangement form a closed loop regulation circuit with the focal spot position as the controlled variable and with the deflection signal as the control parameter.
    Type: Grant
    Filed: January 14, 2004
    Date of Patent: February 21, 2006
    Assignee: Siemens Aktiengesellschaft
    Inventors: Josef Deuringer, Rolf Gurtner, Karsten Zeiske
  • Publication number: 20040190682
    Abstract: In a method and a device for setting the focal spot position of an X-ray tube the focal spot position is regulated as a controlled variable by a closed loop regulation circuit. A deflector deflects the electron beam of the X-ray tube depending on a deflection signal, a deflection closed loop regulator generates the deflection signal depending on a focal spot position signal. A measurement arrangement measures a focal spot position signal.
    Type: Application
    Filed: January 14, 2004
    Publication date: September 30, 2004
    Inventors: Josef Deuringer, Rolf Gurtner, Karsten Zeiske