Patents by Inventor Karthi Sellakkannu

Karthi Sellakkannu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11973680
    Abstract: Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.
    Type: Grant
    Filed: February 9, 2023
    Date of Patent: April 30, 2024
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventors: Derek Lautenschlager, Arun Shrestha, Nishchal Sharma, Vinodev E. Rajasekaran, Karthi Sellakkannu, Sajal Harmukh
  • Publication number: 20230179505
    Abstract: Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.
    Type: Application
    Filed: February 9, 2023
    Publication date: June 8, 2023
    Applicant: Schweitzer Engineering Laboratories, Inc.
    Inventors: Derek Lautenschlager, Arun Shrestha, Nishchal Sharma, Vinodev E. Rajasekaran, Karthi Sellakkannu, Sajal Harmukh