Abstract: A content addressable memory (CAM) of a data processing device can operate in a normal mode or a test mode. In the normal mode, the CAM provides a match value in response to determining that a received data value matches one of a plurality of values stored at memory locations of the CAM. In a test mode of operation, a plurality of test signals are applied to the CAM, and the CAM provides a match value in response to assertion of one of the test signals. The match value is applied to a functional module associated with the CAM to determine a test result. Accordingly, the test signals applied to the CAM provide a flexible way to generate match values and apply those values to the functional module during testing of the data processing device.

Abstract: A circuit including is disclosed. The circuit includes a precharge circuit configured to pull a dynamic node toward a voltage present on the voltage supply node during a precharge phase, and an evaluation circuit configured to, during an evaluation phase, pull the dynamic node toward a ground voltage responsive to a first input condition and configured to inhibit pulling of the dynamic node down responsive to a second input condition. A pull-up circuit coupled between the first dynamic node and the voltage supply node includes first and second pull-up transistors. The first pull-up transistor is configured to activate responsive to the precharge phase. The second pull-up transistor is configured to activate at a delay time subsequent to entry of the evaluation phase. When the first and second pull-up transistors are active, a pull-up path is provided between the dynamic node and the voltage supply node.

Abstract: In accordance with a specific embodiment of the present disclosure, a content addressable memory (CAM) of a data processing device can operate in a normal mode or a test mode. In the normal mode, the CAM provides a match value in response to determining that a received data value matches one of a plurality of values stored at memory locations of the CAM. In a test mode of operation, a plurality of test signals are applied to the CAM, and the CAM provides a match value in response to assertion of one of the test signals. The match value is applied to a functional module associated with the CAM to determine a test result. Accordingly, the test signals applied to the CAM provide a flexible way to generate match values and apply those values to the functional module during testing of the data processing device.