Abstract: A semiconductor stack, including a carrier and a semiconductor device arranged above the carrier; non-releasable interconnections electrically and mechanically connecting the semiconductor device and the carrier; a first contact on at least one of the carrier or the semiconductor device: a second contact on at least one of the carrier or the semiconductor device; an electrical connection structure electrically conductively coupling the first contact and the second contact with each other via at least one non-releasable interconnection of the non-releasable interconnections; and wherein the electrical connection structure comprises a plurality of test diode circuits integrated in at least one of the carrier and the semiconductor device, wherein each of the test diode circuits comprises one or more diodes.

Abstract: In one embodiment, a method for wavelet analysis of one or more time domain reflectometry (TDR) signals to determine one or more characteristics of one or more anomalies in a wire includes receiving a TDR signal that has reflected back up a wire from an anomaly in the wire, calculating a wavelet analysis result from a wavelet analysis of the TDR signal, accessing a library of one or more reference wavelet analysis results that each correspond to one or more known anomalies having one or more known characteristics, and comparing the wavelet analysis result with one or more reference wavelet analysis results. If the wavelet analysis result corresponds to one or more particular reference wavelet analysis results, it is indicated that the anomaly in the wire has one or more particular known characteristics of one or more particular known anomalies corresponding to the one or more particular reference wavelet analysis results.

Abstract: In one embodiment, a method for wavelet analysis of one or more signals to determine one or more characteristics of one or more anomalies in a wire includes receiving a first signal from a detector that has scanned a magnetic field from a wire including an anomaly. The first signal corresponds to a second signal used to generate the magnetic field. The method includes calculating a wavelet analysis result from a wavelet analysis of the first signal. The wavelet analysis result corresponds to the second signal. The method includes accessing a library of one or more reference wavelet analysis results that each correspond to one or more known anomalies having one or more known characteristics and comparing the wavelet analysis result with one or more reference wavelet analysis results.

Abstract: In one embodiment, a method for wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object includes receiving an acoustic signal from an acoustic scan of an object and calculating a wavelet power spectrum of the acoustic signal. The method also includes accessing a library of one or more reference wavelet power spectra that each correspond to one or more objects that comprise one or more known anomalies and comparing the wavelet power spectrum with one or more reference wavelet power spectra. If the wavelet power spectrum from the acoustic scan corresponds to one or more reference wavelet power spectra, analysis results are communicated indicating that the object under analysis comprises one or more particular known anomalies corresponding to the one or more reference wavelet power spectra that correspond to the wavelet power spectrum.

Abstract: In one embodiment, a method for wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object includes receiving an acoustic signal from an acoustic scan of an object and calculating a wavelet power spectrum of the acoustic signal. The method also includes accessing a library of one or more reference wavelet power spectra that each correspond to one or more objects that comprise one or more known anomalies and comparing the wavelet power spectrum with one or more reference wavelet power spectra. If the wavelet power spectrum from the acoustic scan corresponds to one or more reference wavelet power spectra, analysis results are communicated indicating that the object under analysis comprises one or more particular known anomalies corresponding to the one or more reference wavelet power spectra that correspond to the wavelet power spectrum.

Abstract: In one embodiment, a method for wavelet analysis of one or more time domain reflectometry (TDR) signals to determine one or more characteristics of one or more anomalies in a wire includes receiving a TDR signal that has reflected back up a wire from an anomaly in the wire, calculating a wavelet analysis result from a wavelet analysis of the TDR signal, accessing a library of one or more reference wavelet analysis results that each correspond to one or more known anomalies having one or more known characteristics, and comparing the wavelet analysis result with one or more reference wavelet analysis results. If the wavelet analysis result corresponds to one or more particular reference wavelet analysis results, it is indicated that the anomaly in the wire has one or more particular known characteristics of one or more particular known anomalies corresponding to the one or more particular reference wavelet analysis results.