Abstract: A system and method to perform scan testing using a pulse latch with a blocking gate is disclosed. In a particular embodiment, a scan latch includes a pulse latch operable to receive data while a pulse clock signal has a first logical clock value and a blocking gate coupled to an output of the pulse latch. The blocking gate is operable to propagate the data from the output of the pulse latch while the pulse clock signal has a second logical clock value.

Abstract: A system and method to perform scan testing using a pulse latch with a blocking gate is disclosed. In a particular embodiment, a scan latch includes a pulse latch operable to receive data while a pulse clock signal has a first logical clock value and a blocking gate coupled to an output of the pulse latch. The blocking gate is operable to propagate the data from the output of the pulse latch while the pulse clock signal has a second logical clock value.

Abstract: An integrated circuit configured for producing a predetermined output in a sequential circuit during power on is disclosed. The integrated circuit includes one or more capacitors coupled to one or more internal nodes. The one or more capacitors charge the internal nodes if a voltage at the power supply node ramps up to a set voltage at or faster than a period of time. The integrated circuit also includes a first transistor coupled to the power supply node. The first transistor produces leakage current that charges one or more internal nodes when the voltage on the power supply node ramps up to the set voltage no faster than the period of time. The integrated circuit also includes an output node. A logical value on the output node is based on a logical value on the charged internal nodes when an input signal to the sequential circuit is not active and the voltage on the power supply node is at the set voltage.

Abstract: An integrated circuit configured for producing a predetermined output in a sequential circuit during power on is disclosed. The integrated circuit includes one or more capacitors coupled to one or more internal nodes. The one or more capacitors charge the internal nodes if a voltage at the power supply node ramps up to a set voltage at or faster than a period of time. The integrated circuit also includes a first transistor coupled to the power supply node. The first transistor produces leakage current that charges one or more internal nodes when the voltage on the power supply node ramps up to the set voltage no faster than the period of time. The integrated circuit also includes an output node. A logical value on the output node is based on a logical value on the charged internal nodes when an input signal to the sequential circuit is not active and the voltage on the power supply node is at the set voltage.