Abstract: A method of preparing a sample for a charged-particle microscope includes: Providing a substantially plate-like sample holder having opposed first and second major surfaces substantially parallel to one another, comprising at least one aperture connecting said major surfaces and across which a membrane has been spanned upon said first major surface, which membrane comprises at least one perforation; Spanning a film of liquid across said perforation, which liquid comprises at least one study specimen suspended therein; Plunging the sample holder onto a bath of cryogen, whereby the sample holder is held with said first major surface pointing toward the cryogen and arranged substantially parallel to an exposed surface of the cryogen; and Applying a blast of cryogenic fluid to said film from a nozzle pointing toward said second major surface, immediately prior to the film making contact with said cryogen. A corresponding apparatus is also described.

Abstract: A method of preparing a sample for a charged-particle microscope includes: Providing a substantially plate-like sample holder having opposed first and second major surfaces substantially parallel to one another, comprising at least one aperture connecting said major surfaces and across which a membrane has been spanned upon said first major surface, which membrane comprises at least one perforation; Spanning a film of liquid across said perforation, which liquid comprises at least one study specimen suspended therein; Plunging the sample holder onto a bath of cryogen, whereby the sample holder is held with said first major surface pointing toward the cryogen and arranged substantially parallel to an exposed surface of the cryogen; and Applying a blast of cryogenic fluid to said film from a nozzle pointing toward said second major surface, immediately prior to the film making contact with said cryogen. A corresponding apparatus is also described.