Patents by Inventor Kat-Fung Tjew

Kat-Fung Tjew has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9992018
    Abstract: Embodiments of a system or method useful in forcing a computing system to perform a target amount of computations is disclosed. The actual amount of computations may vary from the target amount to within a selected maximum variation. Embodiments of the system or method involve generating a cryptographic challenge to which the computing system needs to compute a response to validate a request from the computing system.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: June 5, 2018
    Assignee: ELECTRONIC ARTS INC.
    Inventor: Kat Fung Tjew
  • Patent number: 6930684
    Abstract: A method for accelerating occlusion culling in a graphics computer is disclosed. A depth test is performed on a fragment for a first time to determine if the fragment is visible. The fragment can be marked as potentially visible if the depth test concluded that the fragment is visible. Subsequently, the depth test is performed on the fragment for a second time to determine if the fragment is visible. If the depth test concludes that the fragment is visible, graphics processing for the fragment can be stopped at this point.
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: August 16, 2005
    Assignee: Broadizon, Inc.
    Inventor: Kat-Fung Tjew
  • Publication number: 20040061699
    Abstract: A method for accelerating occlusion culling in a graphics computer is disclosed. A depth test is performed on a fragment for a first time to determine if the fragment is visible. The fragment can be marked as potentially visible if the depth test concluded that the fragment is visible. Subsequently, the depth test is performed on the fragment for a second time to determine if the fragment is visible. If the depth test concludes that the fragment is visible, graphics processing for the fragment can be stopped at this point.
    Type: Application
    Filed: September 27, 2002
    Publication date: April 1, 2004
    Applicant: Broadizon, Inc.
    Inventor: Kat-Fung Tjew