Patents by Inventor Katherine L. Jungjohann

Katherine L. Jungjohann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated transmission electron microscope
    Patent number: 11081314
    Abstract: An integrated transmission electron microscope comprising multiple electron sources for tuned beams of ultrafast, scanning probe, and parallel illumination in varied beam energies can be alternated within sub-microseconds onto a sample with dynamic ‘transient state’ processes to acquire atomic-scale structural/chemical data with site specificity. The various electron sources and condenser optics enable high-resolution imaging, high-temporal resolution imaging, and chemical imaging, using fast-switching magnets to direct the different electron beams onto a single maneuverable objective pole piece where the sample resides. Such multimodal in situ characterization tools housed in a single microscope have the potential to revolutionize materials science.
    Type: Grant
    Filed: September 28, 2020
    Date of Patent: August 3, 2021
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Katherine L. Jungjohann, Khalid M. Hattar
  • Integrated Transmission Electron Microscope
    Publication number: 20210098227
    Abstract: An integrated transmission electron microscope comprising multiple electron sources for tuned beams of ultrafast, scanning probe, and parallel illumination in varied beam energies can be alternated within sub-microseconds onto a sample with dynamic ‘transient state’ processes to acquire atomic-scale structural/chemical data with site specificity. The various electron sources and condenser optics enable high-resolution imaging, high-temporal resolution imaging, and chemical imaging, using fast-switching magnets to direct the different electron beams onto a single maneuverable objective pole piece where the sample resides. Such multimodal in situ characterization tools housed in a single microscope have the potential to revolutionize materials science.
    Type: Application
    Filed: September 28, 2020
    Publication date: April 1, 2021
    Inventors: Katherine L. Jungjohann, Khalid M. Hattar
  • Active mechanical-environmental-thermal MEMS device for nanoscale characterization
    Patent number: 10641733
    Abstract: A microelectromechanical system (MEMS) device can be used for quantitative mechanical testing of materials within a controlled (chemical and temperature) environment, with the ability for electrochemical control to the specimen, that is coupled with a complimentary in-situ characterization technique.
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: May 5, 2020
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Katherine L. Jungjohann, William Mook, Claire Chisholm, Michael Shaw, Khalid M. Hattar, Paul C. Galambos, Andrew Jay Leenheer, Sean J. Hearne
  • Active Mechanical-Environmental-Thermal MEMS Device for Nanoscale Characterization
    Publication number: 20180266989
    Abstract: A microelectromechanical system (MEMS) device can be used for quantitative mechanical testing of materials within a controlled (chemical and temperature) environment, with the ability for electrochemical control to the specimen, that is coupled with a complimentary in-situ characterization technique.
    Type: Application
    Filed: March 19, 2018
    Publication date: September 20, 2018
    Inventors: Katherine L. Jungjohann, William Mook, Claire Chisholm, Michael Shaw, Khalid M. Hattar, Paul C. Galambos, Andrew Jay Leenheer, Sean J. Hearne