Patents by Inventor Kathi M. Kreske

Kathi M. Kreske has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical examination apparatus particularly useful as a Fizeau interferometer and schlieren device
    Patent number: 4854708
    Abstract: Optical examination apparatus is described including a basic setup comprising a point source of light, a first optical system forming a converging beam of light reflected from the examined object, and a second optical system located to receive the intercepted beam of reflected light, to collimate it, and to direct the collimated beam to a viewing device. The basic setup is capable of combined operation as a Fizeau interferometer, a schlieren device, and/or a moire deflectometer.
    Type: Grant
    Filed: November 23, 1987
    Date of Patent: August 8, 1989
    Assignee: Rotlex Optics Ltd.
    Inventors: Oded Kafri, Kathi M. Kreske