Patents by Inventor Kathleen J. Hird

Kathleen J. Hird has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for characterizing board test coverage
    Patent number: 6948140
    Abstract: Disclosed are methods and apparatus for characterizing board test coverage. In one method, potentially defective properties are enumerated for a board, without regard for how the potentially defective properties might be tested. For each potentially defective property enumerated, a property score is generated. Each property score is indicative of whether a test suite tests for a potentially defective property. Property scores are then combined to characterize board test coverage for the test suite.
    Type: Grant
    Filed: September 1, 2002
    Date of Patent: September 20, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth P. Parker, Kathleen J. Hird, Erik A. Ramos
  • Methods and apparatus for characterizing board test coverage
    Patent number: 6792385
    Abstract: Disclosed are methods and apparatus for characterizing board test coverage. In one method, potentially defective properties are enumerated for a board, without regard for how the potentially defective properties might be tested. For each potentially defective property enumerated, a property score is generated. Each property score is indicative of whether a test suite tests for a potentially defective property. Property scores are then combined in accordance with a weighting structure to characterize board test coverage for the test suite.
    Type: Grant
    Filed: September 1, 2002
    Date of Patent: September 14, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth P. Parker, Kathleen J. Hird, Erik A. Ramos
  • Methods and apparatus for characterizing board test coverage
    Publication number: 20040044973
    Abstract: Disclosed are methods and apparatus for characterizing board test coverage. In one method, potentially defective properties are enumerated for a board, without regard for how the potentially defective properties might be tested. For each potentially defective property enumerated, a property score is generated. Each property score is indicative of whether a test suite tests for a potentially defective property. Property scores are then combined to characterize board test coverage for the test suite.
    Type: Application
    Filed: September 1, 2002
    Publication date: March 4, 2004
    Inventors: Kenneth P. Parker, Kathleen J. Hird, Erik A. Ramos
  • Methods and apparatus for characterizing board test coverage
    Publication number: 20040044498
    Abstract: Disclosed are methods and apparatus for characterizing board test coverage. In one method, potentially defective properties are enumerated for a board, without regard for how the potentially defective properties might be tested. For each potentially defective property enumerated, a property score is generated. Each property score is indicative of whether a test suite tests for a potentially defective property. Property scores are then combined in accordance with a weighting structure to characterize board test coverage for the test suite.
    Type: Application
    Filed: September 1, 2002
    Publication date: March 4, 2004
    Inventors: Kenneth P. Parker, Kathleen J. Hird, Erik A. Ramos